ASE 2026 (series) / Industry Showcase /
MERA: A Multi-expert LLM Framework for Severity Assessment of User Tickets in Mobile OS Beta Testing
Thu 15 Oct 2026 11:30 - 11:45 at Forum 6 - Maintenance and Evolution: Debugging and Fault Localization
Thu 15 OctDisplayed time zone: Amsterdam, Berlin, Bern, Rome, Stockholm, Vienna change
Thu 15 Oct
Displayed time zone: Amsterdam, Berlin, Bern, Rome, Stockholm, Vienna change
10:30 - 12:30 | Maintenance and Evolution: Debugging and Fault LocalizationIndustry Showcase / Journal First / Research Papers at Forum 6 | ||
10:30 15mTalk | Efficient Black-Box Fault Localization for System-Level Test Code Using Large Language Models Journal First Ahmadreza Saboor Yaraghi University of Ottawa, Golnaz Gharachorlu University of Ottawa, Sakina Fatima Fujitsu Research, Lionel Briand University of Ottawa, Canada; Lero centre, University of Limerick, Ireland, Ruiyuan Wan , Ruifeng Gao Huawei Inc. DOI | ||
10:45 15mTalk | COBug: A Bug Localization Pipeline for COBOL: Does It Work? An Exploratory Study Research Papers Kavyasri Gajula Indian Institute of Technology Tirupati, Phanindra Kodela Indian Institute of Technology Tirupati, Sridhar Chimalakonda Indian Institute of Technology Tirupati | ||
11:00 15mTalk | Improving IR-based Bug Localization with Semantics-Driven Query Reduction Journal First DOI | ||
11:15 15mTalk | BugMentor: Generating Answers to Follow-up Questions from Software Bug Reports using Structured Information Retrieval and Neural Text Generation Journal First DOI | ||
11:30 15mTalk | MERA: A Multi-expert LLM Framework for Severity Assessment of User Tickets in Mobile OS Beta Testing Industry Showcase Yongqian Sun Nankai University, Yimin Zuo Nankai University, Qingliang Zhang Nankai University, Bowen Hao Nankai University, Wenwei Gu Nankai University, Jiaqi Luan Nankai University, Sixu Zhou Nankai University, Shenglin Zhang Nankai University, Dan Pei Tsinghua University, China | ||
11:45 15mTalk | Disassembly-Augmented Root Cause Analysis for C/C++ Segmentation Faults in SAP HANA Industry Showcase Jihoon Jung SAP Labs Korea, Chansong You SAP Labs Korea, Jingun Hong SAP Labs Korea, Thomas Bach SAP, Gabin An Korea University | ||
12:00 15mTalk | One Sentence Can Kill the Bug: Auto-replay Mobile App Crashes from One-sentence Overviews Journal First Yuchao Huang , Junjie Wang Institute of Software at Chinese Academy of Sciences, Zhe Liu Institute of Software, Chinese Academy of Sciences, Mingyang Li Institute of Software at Chinese Academy of Sciences; University of Chinese Academy of Sciences, Song Wang York University, Chunyang Chen TU Munich, Yuanzhe Hu Institute of Software, Chinese Academy of Sciences, Qing Wang Institute of Software at Chinese Academy of Sciences DOI | ||