FSE 2026
Sun 5 - Thu 9 July 2026 Montreal, Canada
Wed 8 Jul 2026 11:30 - 11:50 at MB 1.210 - Testing 2 Chair(s): Pengyu Nie

Deep learning (DL)-based systems can exhibit unexpected behavior when exposed to out-of-distribution (OOD) scenarios, posing serious risks in safety-critical domains such as malware detection and autonomous driving. This underscores the importance of thoroughly testing such systems before deployment. To this end, researchers have proposed a wide range of test selection metrics designed to effectively select inputs. However, prior evaluations of metrics reveal three key limitations: (1) narrow testing objectives, for example, many studies assess metrics only for fault detection, leaving their effectiveness for performance estimation unclear; (2) limited coverage of OOD scenarios, with natural and label shifts are rarely considered; (3) Biased dataset selection, where most work focuses on image data while other modalities remain underexplored. Consequently, a unified benchmark that examines how these metrics perform under multiple testing objectives, diverse OOD scenarios, and different data modalities is still lacking. This leaves practitioners uncertain about which test selection metrics are most suitable for their specific objectives and contexts. To address this gap, we conduct an extensive empirical study of 15 existing metrics, evaluating them under three testing objectives (fault detection, performance estimation, and retraining guidance), five types of OOD scenarios (corrupted, adversarial, temporal, natural, and label shifts), three data modalities (image, text, and Android packages), and 13 DL models. In total, our study encompasses 1,640 experimental scenarios, offering a comprehensive evaluation and statistical analysis.

Wed 8 Jul

Displayed time zone: Eastern Time (US & Canada) change

10:30 - 12:30
Testing 2Research Papers / Journal-First Paper at MB 1.210
Chair(s): Pengyu Nie University of Waterloo
10:30
20m
Talk
SETS: A Simple yet Effective DNN Test Selection Approach
Journal-First Paper
Jingling Wang Nanjing University, Huayao Wu Nanjing University, Peng Wang Nanjing University, Xintao Niu Nanjing University, Changhai Nie Nanjing University
10:50
20m
Talk
MetaSel: A Test Selection Approach for Fine-Tuned DNN Models
Journal-First Paper
Amin Abbasishahkoo The School of EECS, University of Ottawa, Mahboubeh Dadkhah University of Ottawa, Lionel Briand University of Ottawa, Canada; Lero centre, University of Limerick, Ireland, Dayi Lin Centre for Software Excellence, Huawei Canada
11:10
20m
Talk
Can Old Tests do New Tricks for Resolving SWE Issues?
Research Papers
Yang Chen University of Illinois at Urbana-Champaign, Toufique Ahmed IBM, Reyhaneh Jabbarvand University of Illinois at Urbana-Champaign, Martin Hirzel IBM Research
Pre-print
11:30
20m
Talk
Empirical Insights of Test Selection Metrics under Multiple Testing Objectives and Distribution Shifts
Research Papers
Jingyu ZHANG Hong Kong Metropolitan University, Fan Wang City University of Hong Kong, Jacky Keung City University of Hong Kong, Yihan Liao City University of Hong Kong, Yan Xiao Sun Yat-sen University, Lei Ma The University of Tokyo & University of Alberta
Pre-print
11:50
20m
Talk
Cross-Refactoring-Type Test Program Migration for Refactoring Engines
Research Papers
Chunhao Dong Beijing Institute of Technology, Yanjie Jiang Tianjin University, Yang Zhang Hebei University of Science and Technology, Yuxia Zhang Beijing Institute of Technology, Hui Liu Beijing Institute of Technology
12:10
20m
Talk
Denoising Fault Localization with Test Line Proximity
Research Papers
Marius Smytzek CISPA Helmholtz Center for Information Security, Andreas Zeller CISPA Helmholtz Center for Information Security
DOI Pre-print