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ISSTA 2018
Sun 15 - Sat 21 July 2018 Amsterdam, Netherlands
co-located with ECOOP and ISSTA
Mon 16 Jul 2018 16:40 - 17:00 at Zurich II - Machine Learning Chair(s): Alex Orso

We have recently witnessed tremendous success of Machine Learning (ML) in practical applications. Computer vision, speech recognition and language translation have all seen a near human level performance. We expect, in the near future, most business applications will have some form of ML. However, verifying the correctness of such applications is extremely challenging and would be very expensive if we follow today’s testing methodologies. In this work, we present an articulation of the challenges in verifying ML based applications. We then present our solution approach, based on the concept of Metamorphic Testing, which aims to identify implementation bugs in ML based image classifiers. We have developed metamorphic relations for an application using Support Vector Machine and an application using Deep Learning. Empirical validation showed that our approach was able to catch 71% of the implementation bugs in the ML applications.

Mon 16 Jul

16:00 - 17:30: ISSTA Technical Papers - Machine Learning at Zurich II
Chair(s): Alex OrsoGeorgia Institute of Technology
issta-2018-Technical-Papers16:00 - 16:20
Chris CumminsUniversity of Edinburgh, Pavlos PetoumenosUniversity of Edinburgh, Alastair MurrayCodeplay Software, Hugh LeatherUniversity of Edinburgh
issta-2018-Technical-Papers16:20 - 16:40
Tien-Duy B. LeSchool of Information Systems, Singapore Management University, David LoSingapore Management University
issta-2018-Technical-Papers16:40 - 17:00
Anurag DwarakanathAccenture Labs, Manish AhujaAccenture Labs, Samarth SikandAccenture Labs, Raghotham M RaoAccenture Labs, R.P. Jagadeesh Chandra BoseAccenture Labs, Neville DubashAccenture Labs, Sanjay Podder
issta-2018-Technical-Papers17:00 - 17:20
Yuhao ZhangPeking University, Yifan ChenPeking University, Shing-Chi CheungDepartment of Computer Science and Engineering, The Hong Kong University of Science and Technology, Yingfei XiongPeking University, Lu ZhangPeking University
issta-2018-Technical-Papers17:20 - 17:30