ICST 2020 (series) / IWCT 2020 (series) / IWCT 2020 /
Generation of Invalid Test Inputs from Over-Constrained Test Models for Combinatorial Robustness Testing
Sat 24 Oct 2020 14:50 - 15:10 at Farfetch (D. Maria) - Test Generation and Combinatorial Testing Applications Session
Testing with invalid test inputs is important to evaluate the robustness of a system. Combinatorial robustness testing is an approach to generate valid and invalid test inputs separately. Unfortunately, it is easy to create over-constrained test models. As a result, not all specified invalid values or invalid value combinations appear in the test suite. Previous work proposed to repair the test model manually or semi-automatically based on conflict detection and diagnosis techniques. In this paper, we extend that work and present a fully-automatic approach that allows to generate invalid test inputs from over-constrained test models based on alternative constraint handling strategies.
Sat 24 OctDisplayed time zone: Lisbon change
Sat 24 Oct
Displayed time zone: Lisbon change
14:20 - 15:10 | |||
14:20 20mFull-paper | An Automata-Based Generation Method for Combinatorial Sequence Testing of Finite State Machines IWCT 2020 Link to publication DOI | ||
14:40 10mShort-paper | Combinatorial Methods for Explainable AI IWCT 2020 Rick Kuhn Natl Institute of Standards & Technology, Raghu Kacker National Institute of Standards and Technology, Jeff Yu Lei University of Texas at Arlington, Dimitris Simos SBA Research Link to publication DOI | ||
14:50 20mFull-paper | Generation of Invalid Test Inputs from Over-Constrained Test Models for Combinatorial Robustness Testing IWCT 2020 Link to publication DOI |