IWCT 2020
Sat 24 Oct 2020 Porto, Portugal
co-located with ICST 2020
Sat 24 Oct 2020 15:40 - 16:00 at Farfetch (D. Maria) - Combinatorial Testing Tools Session

Fault characterization is an important part of combinatorial testing which enables the automatic identification of failure-inducing combinations. Up until now, many different algorithms are proposed to compute failure-inducing combinations. However, the only comparisons between different algorithms are done by the algorithms authors themselves who only evaluate few algorithms at a time which complicates comparisons. Therefore, we present a concept and a reference implementation of a comparison infrastructure that allows to evaluate fault characterization algorithms in a comparable manner. In addition, we report on the results of a preliminary comparison using the comparison infrastructure.

Sat 24 Oct
Times are displayed in time zone: Lisbon change

15:30 - 16:40
Combinatorial Testing Tools SessionIWCT 2020 at Farfetch (D. Maria)
15:30
10m
Short-paper
On Using Ontologies for Testing Compilers
IWCT 2020
Yihao LiInstitute of Technology, Graz University of Technology, Franz WotawaTechnische Universitaet Graz
Link to publication DOI
15:40
20m
Full-paper
A Comparison Infrastructure for Fault Characterization Algorithms
IWCT 2020
Torben FriedrichsRWTH Aachen University, Konrad FögenRWTH Aachen University, Horst LichterRWTH Aachen University
Link to publication DOI
16:00
20m
Full-paper
Avocado: Open-Source Flexible Constrained Interaction Testing for Practical Application
IWCT 2020
Jan RichterCzech Technical University in Prague, Bestoun S. AhmedKarlstad University, Miroslav BuresCzech Technical University in Prague, Cleber R. Rosa JuniorRed Hat, Inc.
Link to publication DOI
16:20
20m
Full-paper
CAGEN: A fast combinatorial test generation tool with support for constraints and higher-index arrays
IWCT 2020
Michael WagnerSBA Research, Kristoffer KleineSBA Research, Dimitris SimosSBA Research, Rick KuhnNatl Institute of Standards & Technology, Raghu KackerNational Institute of Standards and Technology
Link to publication DOI