IWCT 2020
Sat 24 Oct 2020 Porto, Portugal
co-located with ICST 2020

Combinatorial Interaction Testing has been applied to event-driven software systems by using as test suite a set of sequences of inputs in desired combinations. This is generally called combinatorial sequence testing (CST). CST requires possibly new system models from which tests are generated and new test generation methods (or an adaptation of the classical ones). Finite State Machines (FSMs) can easily represent event-based systems where certain inputs are valid only in some states and such constraints can be represented by the incompleteness of the FSM. In this paper, we propose an approach to CST where tests are generated from FSMs which are represented by automata together with test requirements. First, automata can be used to check if test sequences contain invalid inputs. We propose three methods to repair tests with invalid inputs. Moreover, we can directly embed into automata the system constraints over the inputs during generations, to generate only valid test sequences. We compare our automata-based method with the standard approach of Sequences Covering Arrays (SCAs) that produces a set of sequences, all with the same length, composed by the permutation of all the events supported by the system. We found that generating only valid tests from automata provides several advantages iv.r.t. repairing tests and SCAs.

Sat 24 Oct

Displayed time zone: Lisbon change

14:20 - 15:10
Test Generation and Combinatorial Testing Applications SessionIWCT 2020 at Farfetch (D. Maria)
14:20
20m
Full-paper
An Automata-Based Generation Method for Combinatorial Sequence Testing of Finite State Machines
IWCT 2020
Andrea Bombarda University of Bergamo, Angelo Gargantini University of Bergamo
Link to publication DOI
14:40
10m
Short-paper
Combinatorial Methods for Explainable AI
IWCT 2020
Rick Kuhn Natl Institute of Standards & Technology, Raghu Kacker National Institute of Standards and Technology, Jeff Yu Lei University of Texas at Arlington, Dimitris Simos SBA Research
Link to publication DOI
14:50
20m
Full-paper
Generation of Invalid Test Inputs from Over-Constrained Test Models for Combinatorial Robustness Testing
IWCT 2020
Konrad Fögen RWTH Aachen University, Horst Lichter RWTH Aachen University
Link to publication DOI