Sat 24 Oct 2020 14:40 - 14:50 at Farfetch (D. Maria) - Test Generation and Combinatorial Testing Applications Session
This short paper introduces an approach to producing explanations or justifications of decisions made by artificial intelligence and machine learning (AI/ML) systems, using methods derived from fault location in combinatorial testing. We use a conceptually simple scheme to make it easy to justify classification decisions: identifying combinations of features that are present in members of the identified class and absent or rare in non-members. The method has been implemented in a prototype tool, and examples of its application are given.
Sat 24 OctDisplayed time zone: Lisbon change
Sat 24 Oct
Displayed time zone: Lisbon change
14:20 - 15:10 | |||
14:20 20mFull-paper | An Automata-Based Generation Method for Combinatorial Sequence Testing of Finite State Machines IWCT 2020 Link to publication DOI | ||
14:40 10mShort-paper | Combinatorial Methods for Explainable AI IWCT 2020 Rick Kuhn Natl Institute of Standards & Technology, Raghu Kacker National Institute of Standards and Technology, Jeff Yu Lei University of Texas at Arlington, Dimitris Simos SBA Research Link to publication DOI | ||
14:50 20mFull-paper | Generation of Invalid Test Inputs from Over-Constrained Test Models for Combinatorial Robustness Testing IWCT 2020 Link to publication DOI |