ICPC 2018
Sun 27 - Mon 28 May 2018 Gothenburg, Sweden
co-located with * ICSE 2018 *
Sun 27 May 2018 11:17 - 11:34 at R2 - Static and Dynamic Analysis Chair(s): Aiko Yamashita

Background. Source code analysis techniques usually rely on metric-based assessment. However, most of these techniques have low accuracy. One possible reason is because metric thresholds are extracted from classes driven by distinct design decisions. Previous studies have already shown that classes implemented according to some coarse-grained design decisions, such as programming languages, have different distribution of metric values. Therefore, these design decisions should be taken into account when using benchmarks for metric-based source code analysis. Goal. Our goal is to investigate whether other fine-grained design decisions also influence over distribution of software metrics. Method. We conduct an empirical study to evaluate the distributions of four metrics applied over fifteen real-world systems based on three different domains. Initially, we evaluated the influence of the class design role on the distributions of measures. For this purpose, we have defined an automatic approach to identify the design role played by each class. Then, we looked for other fine-grained design decisions that could have influenced the measures. Results. Our findings show that distribution of metrics are sensitive to the following design decisions: (i) design role of the class (ii) used libraries, (iii) coding style, (iv) exception handling, and (v) logging and debugging code mechanisms. Conclusion. The distribution of software metrics are sensitive to fine-grained design decisions and we should consider taking them into account when building benchmarks for metric-based source code analysis.

Sun 27 May

icpc-2018-Technical-Research
11:00 - 12:30: Technical Research - Static and Dynamic Analysis at R2
Chair(s): Aiko YamashitaOslo Metropolitan University
icpc-2018-Technical-Research11:00 - 11:17
Full-paper
Yuriy TymchukSwisscom AG, Mohammad GhafariUniversity of Bern, Oscar NierstraszUniversity of Bern, Switzerland
Link to publication DOI Pre-print
icpc-2018-Technical-Research11:17 - 11:34
Full-paper
Marcos DoseaFederal University of Sergipe and Federal Univeresity of Bahia, Claudio Sant'AnnaFederal University of Bahia, Bruno da SilvaCalifornia Polytechnic State University
DOI Pre-print
icpc-2018-Technical-Research11:34 - 11:44
Short-paper
Kaixie Lyu, Kunihiro NodaTokyo Institute of Technology, Takashi KobayashiTokyo Institute of Technology
Pre-print
icpc-2018-Technical-Research11:44 - 12:01
Full-paper
Yang FengUniversity of California, Irvine, Kaj DreefUniversity of California, Irvine, James JonesUniversity of California, Irvine, Arie van DeursenDelft University of Technology
DOI Pre-print
icpc-2018-Technical-Research12:01 - 12:18
Full-paper
Cong LiuEindhoven University of Technology, Boudewijn Van DongenEindhoven University of Technology, Nour AssyEindhoven University of Technology, Wil van der AalstRWTH Aachen University, Germany
icpc-2018-Technical-Research12:18 - 12:28
Industry talk
Zoltan PorkolabEotvos Lorond University, Dániel KruppEricsson Ltd, Tibor BrunnerEricsson Hungary, Marton CsordasEricsson Hungary
Link to publication DOI Pre-print