TAIC PART 2020

Software testing is the perfect candidate among software engineering activities for the union of academic and industrial minds. The workshop Testing: Academia-Industry Collaboration, Practice and Research Techniques (TAIC PART) is a unique event that provides a stimulating platform to facilitate collaboration between industry and academia on challenging and exciting problems of real-world software testing. The workshop brings together practitioners and academic researchers in a friendly environment with the goal to transfer knowledge, exchange experiences, and enrich the understanding of the opportunities and challenges in the collaboration between the two sides.

TAIC PART 2020 is the 15th edition in a series of highly successful events. Take a look at previous events and discover what happened at TAIC PART in the past years by following the links below. This year, TAIC PART will be co-located with the IEEE International Conference on Software Testing, Verification and Validation (ICST 2020) in Porto, Portugal.

All information about this workshop can be found at the workshop’s official website: http://www.taicpart.org/

Accepted Papers

Call for Submissions

Theme and Goals

TAIC PART is a workshop that aims to forge collaboration between industry and academia on the challenging and exciting problem of real-world software testing. It is promoted by representatives of both industry and academia, bringing together industrial software engineers and testers with researchers working on theory and practice of software testing. TAIC PART expects submissions relevant to practice and research like evaluation of testing approaches by means of industrial surveys, case studies or experiments, experience reports on the application of scientific approaches in industry, or ideas on how to facilitate the knowledge transfer between industry and academia.

The goals of TAIC PART range from the articulation of research questions in the field of software testing and analysis to practical challenges faced in industry. The common theme is the discussion and advancement of approaches and methods for sustainable collaboration between academia and industry in software testing.

Topics of Interest

TAIC PART 2020 invites papers on software testing, verification and validation of the following types:

• Industry experience reports - practical and generalizable insights into how to apply and extend existing approaches to software testing and analysis.
• Research methods for collaborative research - ways that industry and academia can collaborate to further knowledge on testing, verification and validation.
• Industrial challenges with real-world testing - describe a real-world software testing problem for which industry seeks help from academia or vice versa.
• Knowledge exchange between industry and academia - how can new results and knowledge be exchanged between the two partners.

Submission and Proceedings

We invite submissions of the following types:

• Regular Papers (6 pages): Experience reports, research methods, longer challenge papers (optional up to 10 pages).
• Fast Abstracts (up to 2 pages): Challenges in practice and research, work in progress, positions statements.

Regular papers will be evaluated with respect to the real-world significance of the described testing experience as well as their ability to forge partnerships and ultimately yield successful solutions. Fast Abstract papers are short papers that describe late breaking results, works in progress or real-world challenges and will be evaluated according to their ability to generate discussion and suggest interesting areas for future research.

Authors should submit a PDF version of their paper through the TAIC PART 2020 paper submission site: https://easychair.org/conferences/?conf=taicpart2020. Papers must be written in English and conform to the two-column IEEE template for conference proceedings. All papers will undergo a rigorous review by at least three members of the program committee. All accepted papers will be part of the ICST joint workshop proceedings published in the IEEE Digital Library.