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Thomas Bach
conf.researchr.org general profile
ASE 2021 profile
ASE 2022 profile
ASE 2023 profile
ESEC/FSE 2023 profile
ESEIW 2023 profile
ESEIW 2024 profile
ICSME 2024 profile
ICST 2022 profile
ICST 2025 profile
PROFES 2024 profile
SANER 2024 profile
Registered user since Tue 13 Apr 2021
Name:
Thomas Bach
Affiliation:
SAP
Contributions
2025
ICST
Author of Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces within the Industry-track
2024
PROFES
Committee Member in Industrial Papers within the Industry Papers -track
ESEM
Author of Do Test and Environmental Complexity Increase Flakiness? An Empirical Study of SAP HANA within the ESEM IGC-track
ICSME
Author of Just-in-Time Flaky Test Detection via Abstracted Failure Symptom Matching within the Industry Track-track
Author of BIPeC: A Combined Change-Point Analyzer to Identify Performance Regressions in Large-scale Database Systems within the Industry Track-track
2023
ESEC/FSE
Author of A Multidimensional Analysis of Bug Density in SAP HANA within the Industry Papers-track
ESEM
Author of The Vocabulary of Flaky Tests in the Context of SAP HANA within the ESEM IGC-track
ASE
PC Member in Program Committee within the Research Papers-track
2022
ASE
Committee Member in Program Committee within the Research Papers-track
ICST
Author of Automatic Error Classification and Root Cause Determination while Replaying Recorded Workload Data at SAP HANA within the Industry-track
2021
ASE
Committee Member in Program Committee within the Industry Showcase-track
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Sun 9 Feb 02:02