APSEC 2025
Tue 2 - Fri 5 December 2025
Macao, China
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APSEC 2025
(
series
) /
Technical Track
/
Dynamic Variance Reduction-Based Reusable Test Case Generation for Image Classification
Who
Changrong Huang
,
Shunhui Ji
,
Yu Shi
,
Pengcheng Zhang
Track
APSEC 2025 Technical Track
Changrong Huang
Hohai University
Shunhui Ji
Hohai University
China
Yu Shi
Hohai University
Pengcheng Zhang
Hohai University
China
x
Mon 27 Oct 08:38
