Prioritizing Scenarios based on STAMP/STPA Using Statistical Model Checking
Recently, a hazard analysis technique STAMP/STPA has been widely accepted since it is recognized as being suitable for software-intensive systems. Using STAMP/STPA, we can find hazardous scenarios of the target system that cannot be obtained by other traditional hazard analysis methods and those scenarios can be used for validation testing. However, generally the number of obtained scenarios can be huge and the validation testing involves a considerable cost. In this study, we propose a method to prioritize hazardous scenarios identified by STAMP/STPA with the help of a statistical model-checking technique. We give a procedure for systematically transforming the model defined by STAMP/STPA to a formal model for a statistical model-checking tool. We also show the usefulness of the proposed method using an example of train gate control system.
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11:00 - 12:30: Session IIITEQS 2020 at São João Chair(s): Eduard Paul EnoiuMälardalen University ITEQS 2020 is held as a virtual workshop via Zoom. Contact iteqs2020@easychair.org for the details. | |||
11:00 - 11:30 Full-paper | Prioritizing Scenarios based on STAMP/STPA Using Statistical Model Checking ITEQS 2020 Mitsuaki TsujiNara Institute of Science and Technology, Toshinori TakaiNara Institute of Science and Technology, Kazuki KakimotoNara Institute of Science and Technology, Naoki IshihamaJapan Aerospace Exploration Agency, Masafumi KatahiraJapan Aerospace Exploration Agency, Hajimu IidaNara Institute of Science and Technology Link to publication DOI | ||
11:30 - 12:00 Full-paper | Generating Tests for the Discovery of Security Flaws in Product Variants ITEQS 2020 Francisco AraújoLASIGE, Faculdade de Ciências da Universidade de Lisboa, Ibéria MedeirosLaSIGE, Faculdade de Ciências da Universidade de Lisboa, Nuno NevesDI FC UL Link to publication DOI | ||
12:00 - 12:30 Full-paper | Test Data Generation for False Data Injection Attack Testing in Air Traffic Surveillance *Best Paper* ITEQS 2020 Aymeric CretinFemto-ST Institute, Alexandre VernotteFemto-ST Institute, Antoine ChevrotFemto-ST Institute, Fabien PeureuxInstitut FEMTO-ST (UMR CNRS 6174) and Smartesting S&S, Bruno LegeardFEMTO-ST / DISC Link to publication DOI |