Mutation 2020
Sat 24 Oct 2020 Porto, Portugal
co-located with ICST 2020
Sat 24 Oct 2020 16:15 - 16:30 at Arrábida - Session II

Sat 24 Oct

Displayed time zone: Lisbon change

15:15 - 16:30
15:15
15m
Full-paper
SiMut: Exploring Program Similarity to Support the Cost Reduction of Mutation Testing
Mutation 2020
Alessandro V. Pizzoleto Federal University of Sao Carlos, Fabiano Ferrari Federal University of São Carlos, Lucas D. Dallilo University of Sao Paulo, Jeff Offutt George Mason University
Link to publication DOI
15:30
15m
Full-paper
Predicting Survived and Killed Mutants
Mutation 2020
Alejandra Duque Torres Institute of Computer Science, University of Tartu, Natia Doliashvili Institute of Computer Science, University of Tartu, Dietmar Pfahl University of Tartu, Rudolf Ramler Software Competence Center Hagenberg
Link to publication DOI
15:45
15m
Full-paper
Fault Types of Adaptive and Context-Aware Systems and Their Relationship with Fault-based Testing Approaches
Mutation 2020
Bento Rafael Siqueira Federal University of São Carlos, Fabiano Ferrari Federal University of São Carlos, Kathiani E. Souza Federal University of São Carlos, Daniel S. M. Santibáñez Federal University of São Carlos, Valter Vieira Camargo Federal University of São Carlos
Link to publication DOI
16:00
15m
Full-paper
MutantDistiller: Using Symbolic Execution for Automatic Detection of Equivalent Mutants and Generation of Mutant Killing Tests
Mutation 2020
Michael Baer , Norbert Oster , Michael Philippsen Friedrich-Alexander University Erlangen-Nürnberg (FAU)
Link to publication DOI
16:15
15m
Full-paper
An Approach to Identifying Minimal and Equivalent Mutants Based on Source Code Structure
Mutation 2020
Claudinei Brito Junior Universidade de São Paulo, Vinicius Durelli Universidade Federal de São João del-Rei, Rafael S. Durelli Federal University of Lavras Lavras, Simone do Rocio Senger de Souza University of São Paulo - USP, Auri Vincenzi Federal University of São Carlos, Marcio Eduardo Delamaro Universidade de São Paulo
Link to publication DOI