SANER 2024
Tue 12 - Fri 15 March 2024 Rovaniemi , Finland
Thu 14 Mar 2024 12:15 - 12:30 at LAPPI - Defect Prediction and Analysis I Chair(s): Fabio Palomba

Thu 14 Mar

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11:00 - 12:30
Defect Prediction and Analysis IResearch Papers / Journal First Track at LAPPI
Chair(s): Fabio Palomba University of Salerno
11:00
15m
Talk
Investigating and Detecting Silent Bugs in PyTorch Programs
Research Papers
shuo hong Beihang University, Hailong Sun Beihang University, Xiang Gao Beihang University, Shin Hwei Tan Concordia University, Canada
11:15
15m
Talk
BAFLineDP: Code Bilinear Attention Fusion Framework for Line-level Defect Prediction
Research Papers
Shaojian Qiu College of Mathematics and Informatics, South China Agricultural University, Huihao Huang College of Mathematics and Informatics, South China Agricultural University, Jianxiang Luo College of Mathematics and Informatics, South China Agricultural University, Yingjie Kuang College of Mathematics and Informatics, South China Agricultural University, Haoyu Luo College of Mathematics and Informatics, South China Agricultural University
Pre-print
11:30
15m
Talk
WASMDYPA: Effectively Detecting WebAssembly Bugs via Dynamic Program Analysis
Research Papers
Wenlong Zheng University of Science and Technology of China, Baojian Hua University of Science and Technology of China
11:45
15m
Talk
Predicting Line-Level Defects by Capturing Code Contexts with Hierarchical Transformers
Research Papers
Parvez Mahbub Dalhousie University, Masud Rahman Dalhousie University
12:00
15m
Talk
Towards Effective and Efficient Error Handling Code Fuzzing based on Software Fault Injection
Research Papers
Kang Chen Huazhong University of Science and Technology, Ming Wen Huazhong University of Science and Technology, Haoxiang Jia Huazhong University of Science and Technology, Rongxin Wu School of Informatics, Xiamen University, Hai Jin Huazhong University of Science and Technology
12:15
15m
Talk
How Far Does the Predictive Decision Impact the Software Project? The Cost, Service Time, and Failure Analysis from a Cross-Project Defect Prediction Model: An Extended Abstract
Journal First Track
Umamaheswara Sharma B National Institute of Technology, Warangal, RAVICHANDRA SADAM Associate Professor