SANER 2024 (series) / Research Papers /
Predicting Line-Level Defects by Capturing Code Contexts with Hierarchical Transformers
Thu 14 MarDisplayed time zone: Athens change
Thu 14 Mar
Displayed time zone: Athens change
11:00 - 12:30 | Defect Prediction and Analysis IResearch Papers / Journal First Track at LAPPI Chair(s): Fabio Palomba University of Salerno | ||
11:00 15mTalk | Investigating and Detecting Silent Bugs in PyTorch Programs Research Papers shuo hong Beihang University, Hailong Sun Beihang University, Xiang Gao Beihang University, Shin Hwei Tan Concordia University, Canada | ||
11:15 15mTalk | BAFLineDP: Code Bilinear Attention Fusion Framework for Line-level Defect Prediction Research Papers Shaojian Qiu College of Mathematics and Informatics, South China Agricultural University, Huihao Huang College of Mathematics and Informatics, South China Agricultural University, Jianxiang Luo College of Mathematics and Informatics, South China Agricultural University, Yingjie Kuang College of Mathematics and Informatics, South China Agricultural University, Haoyu Luo College of Mathematics and Informatics, South China Agricultural University Pre-print | ||
11:30 15mTalk | WASMDYPA: Effectively Detecting WebAssembly Bugs via Dynamic Program Analysis Research Papers Wenlong Zheng University of Science and Technology of China, Baojian Hua University of Science and Technology of China | ||
11:45 15mTalk | Predicting Line-Level Defects by Capturing Code Contexts with Hierarchical Transformers Research Papers | ||
12:00 15mTalk | Towards Effective and Efficient Error Handling Code Fuzzing based on Software Fault Injection Research Papers Kang Chen Huazhong University of Science and Technology, Ming Wen Huazhong University of Science and Technology, Haoxiang Jia Huazhong University of Science and Technology, Rongxin Wu School of Informatics, Xiamen University, Hai Jin Huazhong University of Science and Technology | ||
12:15 15mTalk | How Far Does the Predictive Decision Impact the Software Project? The Cost, Service Time, and Failure Analysis from a Cross-Project Defect Prediction Model: An Extended Abstract Journal First Track Umamaheswara Sharma B National Institute of Technology, Warangal, RAVICHANDRA SADAM Associate Professor | ||