Hideaki Hata

Registered user since Wed 12 Dec 2018

Name:Hideaki Hata
Country:Japan
Affiliation:Shinshu University
Research interests:Software Ecosystem, Software Economics, Software Maintenance

Contributions

CHASE 2021 PC Member in Program Committee
ASE 2021 Committee Member in Program Committee within the Research Papers-track
Author of FixMe: A GitHub Bot for Detecting and Monitoring On-hold Self-Admitted Technical Debt within the Tool Demonstrations-track
MSR 2021 Committee Member in Program Committee within the Technical Papers-track
SCORE 2021 Committee Member in Program Committee within the SCORE 2021-track
ASE 2020 Committee Member in Program Committee within the Industry Showcase-track
Committee Member in Program Committee within the Research Papers-track
ICGSE 2020 Committee Member in Program Committee
MSR 2020 Ordinary PC member in Program Committee within the Technical Papers-track
ICSE 2021 Author of Predicting Defective Lines Using a Model-Agnostic Technique within the Journal-First Papers-track
Author of Pandemic Programming: How Covid-19 affects software developers and how their organizations can help within the Journal-First Papers-track
Author of Wait For It: Identifying “On-Hold”Self-Admitted Technical Debt within the Journal-First Papers-track
Author of Same File, Different Changes: The Potential of Meta-Maintenance on GitHub within the Technical Track-track
Author of Research Artifact: The Potential of Meta-Maintenance on GitHub within the AE - Artifact Evaluation-track
Author of Ammonia: an Approach for Deriving Project-Specific Bug Patterns within the Journal-First Papers-track
ASE 2019 Committee Member in Program Committee within the Research Papers-track
MSR 2019 Committee Member in Program Committee within the MSR 2019 Technical Papers-track
ICSE 2020 Judge in Judge within the ACM Student Research Competition-track
Author of How different are different diff algorithms in Git? within the Journal First-track
ICSE 2019 Author of 9.6 Million Links in Source Code Comments: Purpose, Evolution, and Decay within the Technical Track-track