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Thu 22 Jun 2017 15:50 - 17:30 at Sala d'Actes, Vertex Building - Grand Challenge

The ACM DEBS 2017 Grand Challenge is the seventh in a series of challenges which seek to provide a common ground and evaluation criteria for a competition aimed at both research and industrial event-based systems. The focus of the 2017 Grand Challenge is on the analysis of the RDF streaming data generated by digital and analogue sensors embedded within manufacturing equipment. The analysis aims at the detection of anomalies in the behavior of such manufacturing equipment. This paper describes the specifics of the data streams and continuous queries that define the DEBS 2017 Grand Challenge. It also describes the benchmarking platform that supports testing of corresponding solutions.

Thu 22 Jun

Displayed time zone: Amsterdam, Berlin, Bern, Rome, Stockholm, Vienna change

15:50 - 17:30
The DEBS 2017 Grand Challenge
DEBS Grand Challenge
Vincenzo Gulisano Chalmers University of Technology, Roman Katerinenko AGT International, Zbigniew Jerzak SAP Research, Martin Strohbach AGT International, Holger Ziekow HS Furtwangen