Donghwan Shin

Registered user since Tue 19 Dec 2017

Name:Donghwan Shin

I am currently a research scientist in Software Verification and Validation group, Interdisciplinary Centre for Security, Reliability and Trust (SnT), University of Luxembourg. I did my PhD under the supervision of Doo-Hwan Bae at Korea Advanced Institute of Science and Technology (KAIST), South Korea; my PhD dissertation was titled: “Diversity-Aware Mutation Adequacy Criterion for Improving the Fault Detection Capability of Test Suites”. I hold a BSc and a MSc in Computing Sciense, both from KAIST, South Korea.

You can find my CV here: link.

Affiliation:University of Luxembourg
Research interests:Software testing, Log-based Software Engineering, Machine learning, Model-based Testing


ICST 2022 Committee Member in Program Committee within the Research Papers-track
Mutation 2021 Committee Member in Program Committee within the Mutation 2021-track
ISSTA 2021 Author of Log-Based Slicing for System-Level Test Cases within the Technical Papers-track
Author of Automatic Test Suite Generation for Key-Points Detection DNNs using Many-Objective Search (Experience Paper) within the Technical Papers-track
ICST 2021 Author of Digital Twins Are Not Monozygotic - Comparing ADAS Testing in Two Industry-Grade Automotive Simulators. within the Industry Track-track
ICST 2020 Author of Comparing Offline and Online Testing of Deep Neural Networks: An Autonomous Car Case Study within the Research Papers-track
Author of Empirical evaluation of mutation-based test case prioritization techniques within the Journal-First Papers-track
ICSE 2020 Committee Member in Youtube Team Leaders within the Virtualization-track
Social Media Co-Chair in Organizing Committee
Programme Committee in Program Committee within the Software Engineering in Practice-track
Session Chair of A1-Autonomous Driving Systems (part of Paper Presentations)
* ICSE 2018 * Author of Are Mutation Scores Correlated with Real Fault Detection? A Large Scale Empirical study on the Relationship Between Mutants and Real Faults within the Technical Papers -track