Vincenzo Riccio

Registered user since Wed 5 Feb 2020

Name:Vincenzo Riccio
Bio:

Vincenzo Riccio is a Postdoctoral Researcher with the Software Institute of Università della Svizzera Italiana (USI) in Lugano, Switzerland. He received his Ph.D. degree in Information Technologies and Electrical Engineering from the University of Naples Federico II (Italy) in 2019. His current research is focused on test automation for mobile and machine learning-based applications. He serves as a reviewer for Software Engineering journals including TOSEM, EMSE, and STVR. He is part of the organizing committee of DeepTest workshop and SBST tool competition. He is Guest Editor of the EMSE journal’s special issue on Software Testing in the Machine Learning Era.

Country:Switzerland
Affiliation:USI Lugano
Research interests:Software Testing, Machine Learning

Contributions

INTUITESTBEDS 2022 Programme Committee in Program Committee within the INTUITESTBEDS 2022-track
MOBILESoft 2022 Committee Member in Program Committee within the Technical Papers-track
DeepTest 2021 Session Chair of Session 2 (part of deeptest2021)
Organization Co-chair in Organizing Committee within the deeptest2021-track
ASE 2021 Author of DeepMetis: Augmenting a Deep Learning Test Set to Increase its Mutation Score within the Artifact Evaluation-track
Author of DeepMetis: Augmenting a Deep Learning Test Set to Increase its Mutation Score within the Research Papers-track
ISSTA 2021 Author of DeepHyperion: Exploring the Feature Space of Deep Learning-Based Systems through Illumination Search within the Artifact Evaluation-track
Author of DeepHyperion: Exploring the Feature Space of Deep Learning-Based Systems through Illumination Search within the Technical Papers-track
ESEC/FSE 2020 Panelist of Conversations on ML Testing 2 within the Paper Presentations-track
Author of Model-Based Exploration of the Frontier of Behaviours for Deep Learning System Testing within the Research Papers-track
ICSE 2020 Author of Taxonomy of Real Faults in Deep Learning Systems within the Technical Papers-track