Write a Blog >>
LCTES 2020
Mon 15 - Fri 19 June 2020
co-located with PLDI 2020
PLDI 2020 (series) / LCTES 2020 (series) / LCTES 2020 /

Exploiting the Trust Between Boundaries: Discovering Memory Corruptions in Printers via Driver Assisted Testing

Xiaoyu He, Erick Bauman, Feng Li, Yu Lei, Linyu Li, Bingchang Liu, Aihua Piao, Kevin Hamlen, Wei Huo, Wei Zou
LCTES 2020
small-avatar
Xiaoyu He
Institute of Information Engineering, Chinese Academy of Sciences & School of Cyber Security, University of Chinese Academy of Sciences
China
small-avatar
Erick Bauman
University of Texas at Dallas
United States
small-avatar
Feng Li
Key Laboratory of Network Assessment Technology, Institute of Information Engineering, Chinese Academy of Sciences, China; School of CyberSpace Security at University of Chinese Academy of Sciences, China
small-avatar
Yu Lei
Institute of Information Engineering, Chinese Academy of Sciences; University of Chinese Academy of Sciences
small-avatar
Linyu Li
Institute of Information Engineering, Chinese Academy of Sciences; University of Chinese Academy of Sciences
small-avatar
Bingchang Liu
Key Laboratory of Network Assessment Technology, Institute of Information Engineering, Chinese Academy of Sciences, China; School of CyberSpace Security at University of Chinese Academy of Sciences, China
small-avatar
Aihua Piao
Institute of Information Engineering, Chinese Academy of Sciences
small-avatar
Kevin Hamlen
University of Texas at Dallas, USA
small-avatar
Wei Huo
Institute of Information Engineering, Chinese Academy of Sciences
small-avatar
Wei Zou
Key Laboratory of Network Assessment Technology, Institute of Information Engineering, Chinese Academy of Sciences, China; School of CyberSpace Security at University of Chinese Academy of Sciences, China