ICST 2023
Sun 16 - Thu 20 April 2023 Dublin, Ireland
Sun 16 Apr 2023 14:30 - 15:00 at Macken - ITEQS III

Testing is an essential process for ensuring the quality of the software. Designing software with as few errors as possible in most embedded systems is often critical. Resource usage is a significant concern for proper behaviour because of the very nature of embedded systems. To design energy-efficient systems, approaches are needed to catch desirable consumption points and correct them before deployment. Model-based testing can reduce testing effort, one testing method that allows for automatic test generation. However, this technique has yet to be studied extensively for revealing resource usage anomalies in embedded systems development. UPPAAL SMC is a statistical model-checking tool that can model the system’s resource usage. This paper shows the tooling needed to achieve this and experimental results on automated test generation and selection using mutation analysis in UPPAAL SMC and how this is applied to a Brake by Wire industrial system. The evaluation shows that this approach, which we call MATS, is applicable and efficient for energy-based test generation.

Sun 16 Apr

Displayed time zone: Dublin change

14:00 - 15:30
ITEQS IIIITEQS at Macken
14:00
30m
Talk
Bottleneck Analysis via Grammar-based Performance Fuzzing
ITEQS
Yavuz Koroglu Graz University of Technology, Franz Wotawa Graz University of Technology
14:30
30m
Talk
Test Generation and Mutation Analysis of Energy Consumption using UPPAAL SMC and MATS
ITEQS
Jonatan Larsson Mälardalen University, Eduard Paul Enoiu Mälardalen University
15:00
10m
Talk
Best paper award and closing
ITEQS