Test Generation and Mutation Analysis of Energy Consumption using UPPAAL SMC and MATS
Testing is an essential process for ensuring the quality of the software. Designing software with as few errors as possible in most embedded systems is often critical. Resource usage is a significant concern for proper behaviour because of the very nature of embedded systems. To design energy-efficient systems, approaches are needed to catch desirable consumption points and correct them before deployment. Model-based testing can reduce testing effort, one testing method that allows for automatic test generation. However, this technique has yet to be studied extensively for revealing resource usage anomalies in embedded systems development. UPPAAL SMC is a statistical model-checking tool that can model the system’s resource usage. This paper shows the tooling needed to achieve this and experimental results on automated test generation and selection using mutation analysis in UPPAAL SMC and how this is applied to a Brake by Wire industrial system. The evaluation shows that this approach, which we call MATS, is applicable and efficient for energy-based test generation.
Sun 16 AprDisplayed time zone: Dublin change
14:00 - 15:30 | |||
14:00 30mTalk | Bottleneck Analysis via Grammar-based Performance Fuzzing ITEQS | ||
14:30 30mTalk | Test Generation and Mutation Analysis of Energy Consumption using UPPAAL SMC and MATS ITEQS | ||
15:00 10mTalk | Best paper award and closing ITEQS |