ICST 2024
Mon 27 - Fri 31 May 2024 Canada

This program is tentative and subject to change.

Thu 30 May 2024 15:30 - 16:30 at Room 1 - Most Influential Paper

We present MUSE (MUtation-baSEd fault localization technique), a new fault localization technique based on mutation analysis. A key idea of MUSE is to identify a faulty statement by utilizing different characteristics of two groups of mutants-one that mutates a faulty statement and the other that mutates a correct statement. We also propose a new evaluation metric for fault localization techniques based on information theory, called Locality Information Loss (LIL): it can measure the aptitude of a localization technique for automated fault repair systems as well as human debuggers. The empirical evaluation using 14 faulty versions of the five real-world programs shows that MUSE localizes a fault after reviewing 7.4 statements on average, which is about 25 times more precise than the state-of-the-art SBFL technique Op2.

This program is tentative and subject to change.

Thu 30 May

Displayed time zone: Eastern Time (US & Canada) change

15:30 - 16:30
Most Influential PaperMost Influential Paper at Room 1
15:30
60m
Talk
Ask the Mutants: Mutating Faulty Programs for Fault Localization
Most Influential Paper
SEOKHYEON MOON Samsung SDS, Yunho Kim Hanyang University, Moonzoo Kim KAIST / VPlusLab Inc. , Shin Yoo Korea Advanced Institute of Science and Technology