ICST 2024
Mon 27 - Fri 31 May 2024 Canada

This program is tentative and subject to change.

Fri 31 May 2024 11:40 - 12:00 at Room 1 - Testing and Applications

This program is tentative and subject to change.

Fri 31 May

Displayed time zone: Eastern Time (US & Canada) change

11:00 - 12:20
11:00
20m
Industry talk
In industrial embedded software, are some compilation errors easier to localize and fix than others?
Industry
Han Fu , Sigrid Eldh Ericsson AB, Mälardalen University, Carleton Unviersity, Kristian Wiklund Ericsson AB, Andreas Ermedahl , Philipp Haller KTH Royal Institute of Technology, Cyrille Artho KTH Royal Institute of Technology, Sweden
11:20
20m
Research paper
Brewing Up Reliability: Espresso Test Generation for Android Apps
Research Papers
Iván Arcuschin Moreno University of Buenos Aires, Argentina, Lisandro Di Meo , Michael Auer University of Passau, Juan Pablo Galeotti University of Buenos Aires, Gordon Fraser University of Passau
11:40
20m
Research paper
Differential Optimization Testing of Gremlin-Based Graph Database Systems
Research Papers
Yingying Zheng Institute of Software Chinese Academy of Sciences, Wensheng Dou Institute of Software Chinese Academy of Sciences, Lei Tang Institute of Software Chinese Academy of Sciences, Ziyu Cui Institute of Software Chinese Academy of Sciences, Jiansen Song Institute of Software Chinese Academy of Sciences, Ziyue Cheng , Wei Wang , Jun Wei Institute of Software at Chinese Academy of Sciences; University of Chinese Academy of Sciences; University of Chinese Academy of Sciences Chongqing School, Hua Zhong , Tao Huang Institute of Software Chinese Academy of Sciences
12:00
10m
Demonstration
MLHCBugs: A Framework to Reproduce Real Faults in Healthcare Machine Learning Applications
Testing Tools and Demonstration
Guna Sekaran Jaganathan , Nazmul Kazi , Indika Kahanda University of North Florida, Upulee Kanewala University of North Florida
12:10
10m
Demonstration
The GitHub Recent Bugs Dataset for Evaluating LLM-based Debugging Applications
Testing Tools and Demonstration
Jae Yong Lee , Sungmin Kang , Juyeon Yoon Korea Advanced Institute of Science and Technology, Shin Yoo Korea Advanced Institute of Science and Technology