Massively Parallel, Highly Efficient, but What About the Test Suite Quality? Applying Mutation Testing to GPU Programs
Tue 27 Oct 2020 01:15 - 01:45 at Infante - RT7 - Optimizing Testing Chair(s): Corina S. Pasareanu
Thanks to rapid advances in programmability and performance, GPUs have been widely applied in High-Performance Computing (HPC) and safety-critical domains. As such, quality assurance of GPU applications has gained increasing attention. This brings us to mutation testing, a fault-based testing technique that assesses the test suite quality by systematically introducing small artificial faults. It has been shown to perform well in exposing faults. In this paper, we investigate whether GPU programming can benefit from mutation testing. In addition to conventional mutation operators, we propose nine GPU-specific mutation operators based on the core syntax differences between CPU and GPU programming. We conduct a preliminary study on six CUDA systems. The results show that mutation testing can effectively evaluate the test quality of GPU programs: conventional mutation operators can guide the engineers to write simple direct tests, while GPU-specific mutation operators can lead to more intricate test cases which are better at revealing GPU-specific weaknesses.
Mon 26 OctDisplayed time zone: Lisbon change
13:45 - 15:15 | RT7 - Optimizing TestingResearch Papers at Infante +11h Chair(s): Fabiano Ferrari Federal University of São Carlos | ||
13:45 30mTalk | Optimizing Mutation Testing by Discovering Dynamic Mutant Subsumption Relations Research Papers Marcio Augusto Guimarães Federal University of Alagoas (UFAL), Leo Fernandes Federal Institute of Alagoas (IFAL), Márcio Ribeiro Federal University of Alagoas, Brazil, Marcelo d'Amorim Federal University of Pernambuco, Rohit Gheyi Federal University of Campina Grande Link to publication DOI | ||
14:15 30mTalk | Massively Parallel, Highly Efficient, but What About the Test Suite Quality? Applying Mutation Testing to GPU Programs Research Papers Link to publication DOI Pre-print | ||
14:45 30mTalk | STICCER: Fast and Effective Database Test Suite Reduction Through Merging of Similar Test Cases Research Papers Abdullah Alsharif The University of Sheffield, Gregory Kapfhammer Allegheny College, USA, Phil McMinn University of Sheffield Link to publication DOI |