International Conference on Software and Systems Reuse, Product Lines, and Configuration
The International Conference on Software and Systems Reuse, Product Lines, and Configuration (VARIABILITY 2026) invites high-quality contributions from researchers and practitioners in software engineering, systems engineering, and related disciplines focussing on a broad spectrum of methods, concepts, and tools for variability. VARIABILITY aims to be the premier forum for the exchange of ideas, experiences, and results in all aspects of software and systems variability management, reuse, software configuration, and customization. As software and systems become increasingly configurable, reusable, and adaptable, managing their variability across all lifecycle phases is more critical—and more challenging—than ever. VARIABILITY 2026 seeks to bring together the diverse communities that address these challenges from theoretical, technical, and practical perspectives. VARIABILITY results from a merge of three prominent conferences focussing on software and systems variability, configuration and reuse: SPLC (the International Systems and Software Product Line Conference, 29 successful editions), VaMoS (the International Working Conference on Variability Modelling of Software-Intensive Systems, 19 successful editions), and ICSR (the International Conference on Systems and Software Reuse, 22 successful editions). VARIABILITY is by design open as a conference. It welcomes new fields of variability-intensive research, such as artificial intelligence, hybrid software-hardware systems, etc. For this first edition of VARIABILITY, we strive to continue the success of the predecessor conferences ICSR, SPLC, and VaMoS by welcoming high-quality submissions for the research track in numerous closely related areas, such as systems and software product lines, systems and software reuse, configurable systems and software, product configuration, and systems and software variability. We will award the best research paper and the best artifact paper.
