Deep Learning and Data Augmentation for Detecting Self-Admitted Technical Debt
This program is tentative and subject to change.
Self Admitted Technical Debt (SATD) refers to circumstances where developers use textual artifacts to explain why the existing implementation is not optimal. Past research in detecting SATD has focused on either identifying SATD (classifying SATD items as SATD or not) or categorizing SATD (labeling instances as SATD that pertain to requirement, design, code, test, etc.). However, the performance of these approaches remains suboptimal, particularly for specific types of SATD, such as test and requirement debt, primarily due to extremely imbalanced datasets. To address these challenges, we build on earlier research by utilizing BiLSTM architecture for the binary identification of SATD and BERT architecture for categorizing different types of SATD. Despite their effectiveness, both architectures struggle with imbalanced data. Therefore, we employ a large language model data augmentation strategy to mitigate this issue. Furthermore, we introduce a two-step approach to identify and categorize SATD across various datasets derived from different artifacts. Our contributions include providing a balanced dataset for future SATD researchers and demonstrating that our approach significantly improves SATD identification and categorization performance compared to baseline methods.
This program is tentative and subject to change.
Thu 5 DecDisplayed time zone: Beijing, Chongqing, Hong Kong, Urumqi change
16:00 - 17:30 | |||
16:00 30mTalk | On the Relative Value of Feature Selection Techniques for Code Smell Detection Technical Track Zexian Zhang Wuhan University of Technology, Shuang Yin Wuhan University of Technology, Lin Zhu Wuhan University of Technology, Shan Gao Hokkaido University, Haoxuan Chen Wuhan University of Technology, Wenhua Hu Wuhan University of Technology, Fuyang Li Wuhan University of Technology | ||
16:30 30mTalk | An Empirical Study on Self-Admitted Technical Debt in Quantum Software Technical Track Yuta Ishimoto Kyushu University, Yuto Nakamura Kyushu University, Ryota Katsube Hitachi, Ltd., Naoto Sato Research & Development Group, Hitachi, Ltd., Hideto Ogawa Hitachi Ltd., Masanari Kondo Kyushu University, Yasutaka Kamei Kyushu University, Naoyasu Ubayashi Kyushu University | ||
17:00 30mTalk | Deep Learning and Data Augmentation for Detecting Self-Admitted Technical Debt Technical Track Edi Sutoyo Bernoulli Institute for Mathematics, Computer Science and Artificial Intelligence, University of Groningen, Paris Avgeriou University of Groningen, The Netherlands, Andrea Capiluppi University of Groningen |