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ICSE 2021
Mon 17 May - Sat 5 June 2021

Thu 27 May

Displayed time zone: Amsterdam, Berlin, Bern, Rome, Stockholm, Vienna change

10:00 - 11:00
3.1.3. Defect Prediction: Automation #2Journal-First Papers at Blended Sessions Room 3 +12h
Chair(s): Robert Feldt Chalmers | University of Gothenburg, Blekinge Institute of Technology
10:00
20m
Paper
Revisiting Supervised and Unsupervised Methods for Effort-Aware Cross-Project Defect PredictionJournal-First
Journal-First Papers
Chao Ni Zhejiang University, Xin Xia Huawei Software Engineering Application Technology Lab, David Lo Singapore Management University, Xiang Chen Nantong University, Qing Gu Nanjing University
Pre-print Media Attached
10:20
20m
Paper
Ammonia: an Approach for Deriving Project-Specific Bug PatternsJournal-First
Journal-First Papers
Yoshiki Higo Osaka University, Shinpei Hayashi Tokyo Institute of Technology, Hideaki Hata Shinshu University, Mei Nagappan University of Waterloo
Link to publication DOI Authorizer link Pre-print Media Attached
10:40
20m
Paper
Predicting Defective Lines Using a Model-Agnostic TechniqueJournal-First
Journal-First Papers
Supatsara Wattanakriengkrai Nara Institute of Science and Technology, Patanamon Thongtanunam University of Melbourne, Chakkrit Tantithamthavorn Monash University, Hideaki Hata Shinshu University, Kenichi Matsumoto Nara Institute of Science and Technology
DOI Pre-print Media Attached
22:00 - 23:00
3.1.3. Defect Prediction: Automation #2Journal-First Papers at Blended Sessions Room 3
22:00
20m
Paper
Revisiting Supervised and Unsupervised Methods for Effort-Aware Cross-Project Defect PredictionJournal-First
Journal-First Papers
Chao Ni Zhejiang University, Xin Xia Huawei Software Engineering Application Technology Lab, David Lo Singapore Management University, Xiang Chen Nantong University, Qing Gu Nanjing University
Pre-print Media Attached
22:20
20m
Paper
Ammonia: an Approach for Deriving Project-Specific Bug PatternsJournal-First
Journal-First Papers
Yoshiki Higo Osaka University, Shinpei Hayashi Tokyo Institute of Technology, Hideaki Hata Shinshu University, Mei Nagappan University of Waterloo
Link to publication DOI Authorizer link Pre-print Media Attached
22:40
20m
Paper
Predicting Defective Lines Using a Model-Agnostic TechniqueJournal-First
Journal-First Papers
Supatsara Wattanakriengkrai Nara Institute of Science and Technology, Patanamon Thongtanunam University of Melbourne, Chakkrit Tantithamthavorn Monash University, Hideaki Hata Shinshu University, Kenichi Matsumoto Nara Institute of Science and Technology
DOI Pre-print Media Attached