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ICSE 2021
Mon 17 May - Sat 5 June 2021

Conference Day
Thu 27 May

Displayed time zone: Amsterdam, Berlin, Bern, Rome, Stockholm, Vienna change

10:00 - 11:00
3.1.3. Defect Prediction: Automation #2Journal-First Papers at Blended Sessions Room 3 +12h
Chair(s): Robert FeldtChalmers | University of Gothenburg, Blekinge Institute of Technology
10:00
20m
Paper
Revisiting Supervised and Unsupervised Methods for Effort-Aware Cross-Project Defect PredictionJournal-First
Journal-First Papers
Chao NiZhejiang University, Xin XiaHuawei Software Engineering Application Technology Lab, David LoSingapore Management University, Xiang ChenNantong University, Qing GuNanjing University
Pre-print Media Attached
10:20
20m
Paper
Ammonia: an Approach for Deriving Project-Specific Bug PatternsJournal-First
Journal-First Papers
Yoshiki HigoOsaka University, Shinpei HayashiTokyo Institute of Technology, Hideaki HataShinshu University, Mei NagappanUniversity of Waterloo
Link to publication DOI Authorizer link Pre-print Media Attached
10:40
20m
Paper
Predicting Defective Lines Using a Model-Agnostic TechniqueJournal-First
Journal-First Papers
Supatsara WattanakriengkraiNara Institute of Science and Technology, Patanamon ThongtanunamUniversity of Melbourne, Chakkrit TantithamthavornMonash University, Hideaki HataShinshu University, Kenichi MatsumotoNara Institute of Science and Technology
DOI Pre-print Media Attached
22:00 - 23:00
3.1.3. Defect Prediction: Automation #2Journal-First Papers at Blended Sessions Room 3
22:00
20m
Paper
Revisiting Supervised and Unsupervised Methods for Effort-Aware Cross-Project Defect PredictionJournal-First
Journal-First Papers
Chao NiZhejiang University, Xin XiaHuawei Software Engineering Application Technology Lab, David LoSingapore Management University, Xiang ChenNantong University, Qing GuNanjing University
Pre-print Media Attached
22:20
20m
Paper
Ammonia: an Approach for Deriving Project-Specific Bug PatternsJournal-First
Journal-First Papers
Yoshiki HigoOsaka University, Shinpei HayashiTokyo Institute of Technology, Hideaki HataShinshu University, Mei NagappanUniversity of Waterloo
Link to publication DOI Authorizer link Pre-print Media Attached
22:40
20m
Paper
Predicting Defective Lines Using a Model-Agnostic TechniqueJournal-First
Journal-First Papers
Supatsara WattanakriengkraiNara Institute of Science and Technology, Patanamon ThongtanunamUniversity of Melbourne, Chakkrit TantithamthavornMonash University, Hideaki HataShinshu University, Kenichi MatsumotoNara Institute of Science and Technology
DOI Pre-print Media Attached