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ICSE 2021
Mon 17 May - Sat 5 June 2021
Wed 26 May 2021 20:40 - 21:00 at Blended Sessions Room 4 - 2.6.4. Fault Localization #1 Chair(s): Leonardo Mariani
Thu 27 May 2021 08:40 - 09:00 at Blended Sessions Room 4 - 2.6.4. Fault Localization #1

Conference Day
Wed 26 May

Displayed time zone: Amsterdam, Berlin, Bern, Rome, Stockholm, Vienna change

20:40 - 21:40
2.6.4. Fault Localization #1Technical Track / SEIP - Software Engineering in Practice at Blended Sessions Room 4 +12h
Chair(s): Leonardo MarianiUniversity of Milano Bicocca
20:40
20m
Paper
Industry-scale IR-based Bug Localization: A Perspective from FacebookSEIP
SEIP - Software Engineering in Practice
Vijayaraghavan MuraliFacebook, Inc., Lee GrossFacebook, Rebecca QianFacebook, Inc., Satish ChandraFacebook, USA
Pre-print Media Attached
21:00
20m
Paper
FLACK: Counterexample-Guided Fault Localization for Alloy ModelsArtifact ReusableTechnical TrackArtifact Available
Technical Track
Guolong ZhengUniversity of Nebraska Lincoln, ThanhVu NguyenUniversity of Nebraska, Lincoln, Simón Gutiérrez BridaUniversity of Rio Cuarto and CONICET, Argentina, Germán RegisUniversity of Rio Cuarto, Argentina, Marcelo F. FriasDept. of Software Engineering Instituto Tecnológico de Buenos Aires, Nazareno AguirreUniversity of Rio Cuarto and CONICET, Argentina, Hamid BagheriUniversity of Nebraska-Lincoln
Pre-print Media Attached
21:20
20m
Paper
Improving Fault Localization by Integrating Value and Predicate Based Causal Inference TechniquesACM SIGSOFT Distinguished PaperArtifact ReusableTechnical TrackArtifact Available
Technical Track
Yigit KucukCase Western Reserve University, Tim A. D. HendersonGoogle, Andy PodgurskiCase Western Reserve University
Pre-print Media Attached

Conference Day
Thu 27 May

Displayed time zone: Amsterdam, Berlin, Bern, Rome, Stockholm, Vienna change

08:40 - 09:40
08:40
20m
Paper
Industry-scale IR-based Bug Localization: A Perspective from FacebookSEIP
SEIP - Software Engineering in Practice
Vijayaraghavan MuraliFacebook, Inc., Lee GrossFacebook, Rebecca QianFacebook, Inc., Satish ChandraFacebook, USA
Pre-print Media Attached
09:00
20m
Paper
FLACK: Counterexample-Guided Fault Localization for Alloy ModelsArtifact ReusableTechnical TrackArtifact Available
Technical Track
Guolong ZhengUniversity of Nebraska Lincoln, ThanhVu NguyenUniversity of Nebraska, Lincoln, Simón Gutiérrez BridaUniversity of Rio Cuarto and CONICET, Argentina, Germán RegisUniversity of Rio Cuarto, Argentina, Marcelo F. FriasDept. of Software Engineering Instituto Tecnológico de Buenos Aires, Nazareno AguirreUniversity of Rio Cuarto and CONICET, Argentina, Hamid BagheriUniversity of Nebraska-Lincoln
Pre-print Media Attached
09:20
20m
Paper
Improving Fault Localization by Integrating Value and Predicate Based Causal Inference TechniquesACM SIGSOFT Distinguished PaperArtifact ReusableTechnical TrackArtifact Available
Technical Track
Yigit KucukCase Western Reserve University, Tim A. D. HendersonGoogle, Andy PodgurskiCase Western Reserve University
Pre-print Media Attached