The SZZ algorithm has been widely used for identifying bug-inducing commits. However, it suffers from low precision, as not all deletion lines in the bug-fixing commit are related to the bug fix. Previous studies have attempted to address this issue by using static methods to filter out noise, e.g., comments and refactoring operations in the bug-fixing commit. However, these methods have two limitations. First, it is challenging to include all refactoring and non-essential change patterns in a tool, leading to the potential exclusion of relevant lines and the inclusion of irrelevant lines. Second, applying these tools might not always improve performance.
In this paper, to address the aforementioned challenges, we propose NEURALSZZ, a deep learning approach for detecting the root cause deletion lines in a bug-fixing commit and using them as input for the SZZ algorithm. NEURALSZZ first constructs a heterogeneous graph attention network model that captures the semantic relationships between each deletion line and the other deletion and addition lines. To pinpoint the root cause of a bug, NEURALSZZ uses a learning-to-rank technique to rank all deletion lines in the commit. To evaluate the effectiveness of NEURALSZZ, we utilize three datasets containing high-quality bug-fixing and bug-inducing commits. The experiment results show that NEURALSZZ outperforms various baseline methods, e.g., traditional machine learning-based approaches and Bi-LSTM in identifying the root cause of bugs. Moreover, by utilizing the top-ranked deletion lines and applying the SZZ algorithm, NEURALSZZ demonstrates better precision and F1- score compared to previous SZZ algorithms.
Wed 13 SepDisplayed time zone: Amsterdam, Berlin, Bern, Rome, Stockholm, Vienna change
15:30 - 17:00 | Bug DetectionResearch Papers / Journal-first Papers at Room D Chair(s): Andreea Vescan Babes-Bolyai University | ||
15:30 12mTalk | A Comparative Study of Transformer-based Neural Text Representation Techniques on Bug Triaging Research Papers File Attached | ||
15:42 12mTalk | Duplicate Bug Report Detection: How Far Are We? Journal-first Papers Ting Zhang Singapore Management University, DongGyun Han Royal Holloway, University of London, Venkatesh Vinayakarao Chennai Mathematical Institute, Ivana Clairine Irsan Singapore Management University, Bowen Xu North Carolina State University, Ferdian Thung Singapore Management University, David Lo Singapore Management University, Lingxiao Jiang Singapore Management University Link to publication DOI File Attached | ||
15:54 12mTalk | Neural SZZ Algorithm Research Papers LingXiao Tang zhejiang university, Lingfeng Bao Zhejiang University, Xin Xia Huawei Technologies, Zhongdong Huang Zhejiang University Pre-print | ||
16:06 12mTalk | How to Train Your Neural Bug Detector: Artificial vs Real Bugs Research Papers Cedric Richter Carl von Ossietzky Universität Oldenburg / University of Oldenburg, Heike Wehrheim Carl von Ossietzky Universität Oldenburg / University of Oldenburg Pre-print File Attached | ||
16:18 12mTalk | Detection of Java Basic Thread Misuses Based on Static Event Analysis Research Papers Baoquan Cui Institute of Software at Chinese Academy of Sciences, China, MiaoMiao Wang Technology Center of Software Engineering, ISCAS, China. University of Chinese Academy of Sciences, China., Chi Zhang State Key Laboratory of Computer Science, Institute of Software, Chinese Academy of Sciences, Beijing, China, Jiwei Yan Institute of Software at Chinese Academy of Sciences, China, Jun Yan Institute of Software at Chinese Academy of Sciences; University of Chinese Academy of Sciences, Jian Zhang Institute of Software at Chinese Academy of Sciences; University of Chinese Academy of Sciences File Attached | ||
16:30 12mFull-paper | On effort-aware metrics for defect prediction Journal-first Papers Jonida Çarka University of Rome Tor Vergata, Matteo Esposito University of Rome Tor Vergata, Falessi Davide University of Rome Tor Vergata DOI File Attached | ||
16:42 12mTalk | FLUX: Finding Bugs with LLVM IR Based Unit Test Crossovers Research Papers Eric Liu University of Toronto, Shengjie Xu University of Toronto, David Lie University of Toronto, Canada Pre-print File Attached |