ASE 2025
Sun 16 - Thu 20 November 2025 Seoul, South Korea

This program is tentative and subject to change.

Wed 19 Nov 2025 16:30 - 16:40 at Grand Hall 1 - Testing & Analysis 3

Mobile acceptance testing remains a bottleneck in modern software development, particularly for cross-platform mobile development using frameworks like Flutter. While developers increasingly rely on automated testing tools, creating and maintaining acceptance test artifacts still demands significant manual effort. To help tackle this issue, we introduce AToMIC, an automated framework leveraging specialized Large Language Models to generate Gherkin scenarios, Page Objects, and executable UI test scripts directly from requirements (JIRA tickets) and recent code changes. Applied to BMW’s MyBMW app, covering 13 real-world issues in a 170+ screen codebase, AToMIC produced executable test artifacts in under five minutes per feature on standard hardware. The generated artifacts were of high quality: 93.3% of Gherkin scenarios were syntactically correct upon generation, 78.8% of PageObjects ran without manual edits, and 100% of generated UI tests executed successfully. In a survey, all practitioners reported time savings (often a full developer-day per feature) and strong confidence in adopting the approach. These results confirm AToMIC as a scalable, practical solution for streamlining acceptance test creation and maintenance in industrial mobile projects.

This program is tentative and subject to change.

Wed 19 Nov

Displayed time zone: Seoul change

16:00 - 17:00
Testing & Analysis 3NIER Track / Industry Showcase at Grand Hall 1
16:00
10m
Talk
Acceleration of Automotive Software Development by Retrieval Augmented Integration Test Script Generation
Industry Showcase
Masashi Mizoguchi Hitachi Ltd., Kentaro Yoshimura Hitachi, Ltd., Keita Nakazawa Astemo, Ltd., Yasuomi D. Sato Astemo, Ltd., Takahiro Iida Astemo, Ltd., Fumio Narisawa Astemo, Ltd.
16:10
10m
Talk
LLM-Powered Fully Automated Chaos Engineering: Towards Enabling Anyone to Build Resilient Software Systems at Low Cost
NIER Track
Daisuke Kikuta NTT, Inc., Hiroki Ikeuchi NTT, Inc., Kengo Tajiri NTT, Inc.
Pre-print Media Attached
16:20
10m
Talk
Practical Escape of Exploration Tarpits for Mini-Game Testing in an Industrial Setting
Industry Showcase
Yuan Cao Peking University, Dezhi Ran Peking University, Haochuan Lu Tencent, Chao Guo Tencent Inc., Xuran Hao Peking University, Zhuoru Chen Capital Normal University, Ting Xiong Tencent Inc., Yuetang Deng Tencent, Tao Xie Peking University
16:30
10m
Talk
Streamlining Acceptance Test Generation for Mobile Applications Through Large Language Models: An Industrial Case Study
Industry Showcase
Pedro Luís Fonseca Critical TechWorks and Faculty of Engineering, University of Porto, Bruno Lima LIACC, Faculty of Engineering, University of Porto, João Pascoal Faria Faculty of Engineering, University of Porto and INESC TEC
Pre-print
16:40
10m
Talk
Context-Sensitive Pointer Analysis for ArkTS
Industry Showcase
Yizhuo Yang Beihang University, Lingyun Xu Huawei, Mingyi Zhou Beihang University, Li Li Beihang University
16:50
10m
Talk
Element-Aware Fine-Tuning of Vision-Language Models for Cost-Efficient GUI Testing in an Industrial Setting
Industry Showcase
Mengzhou Wu Peking University, Yuzhe Guo Beijing Jiaotong University, Yuan Cao Peking University, Haochuan Lu Tencent, Hengyu Zhang Tencent Inc., Xia Zeng Tencent, Liangchao Yao Tencent Inc., Yuetang Deng Tencent, Dezhi Ran Peking University, Wei Yang UT Dallas, Tao Xie Peking University