ASE 2025
Sun 16 - Thu 20 November 2025 Seoul, South Korea

This program is tentative and subject to change.

Wed 19 Nov 2025 15:10 - 15:20 at Vista - Test Generation, Selection & Prioritization 2

Deep neural network (DNN) mutation analysis is a promising approach to evaluating test set adequacy. Due to the large number of generated mutants that must be tested on large datasets, mutation analysis is costly. In this paper, we present a technique, named DM#, for accelerating DNN mutation testing using Fourier analysis. The key insight is that DNN outputs are real-valued functions suitable for Fourier analysis that can be leveraged to quantify mutant behavior using only a few data points. DM# uses the quantified mutant behavior to cluster the mutants so that the ones with similar behavior fall into the same group. A representative from each group is then selected for testing, and the result of the test, e.g., whether the mutant is killed or survived, is reused for all other mutants represented by the selected mutant, obviating the need for testing other mutants. 14 DNN models of sizes ranging from thousands to millions of parameters, trained on different datasets, are used to evaluate DM# and compare it to several baseline techniques. Our results provide empirical evidence on the effectiveness of DM# in accelerating mutation testing by 28.38%, on average, at the average cost of only 0.72% error in mutation score. Moreover, on average, DM# incurs 11.78, 15.16, and 114.36 times less mutation score error compared to random mutant selection, boundary sample selection, and random sample selection techniques, respectively, while generally offering comparable speed-up.

This program is tentative and subject to change.

Wed 19 Nov

Displayed time zone: Seoul change

14:00 - 15:30
Test Generation, Selection & Prioritization 2Research Papers / Journal-First Track at Vista
14:00
10m
Talk
LLMs for Automated Unit Test Generation and Assessment in Java: The AgoneTest Framework
Research Papers
Andrea Lops Polytechnic University of Bari, Italy, Fedelucio Narducci Polytechnic University of Bari, Azzurra Ragone University of Bari, Michelantonio Trizio Wideverse, Claudio Bartolini Wideverse s.r.l.
14:10
10m
Talk
µOpTime: Statically Reducing the Execution Time of Microbenchmark Suites Using Stability Metrics
Journal-First Track
Nils Japke TU Berlin & ECDF, Martin Grambow TU Berlin & ECDF, Christoph Laaber Simula Research Laboratory, David Bermbach TU Berlin
14:20
10m
Talk
Reference-Based Retrieval-Augmented Unit Test Generation
Journal-First Track
Zhe Zhang Beihang University, Liu Xingyu Beihang University, Yuanzhang Lin Beihang University, Xiang Gao Beihang University, Hailong Sun Beihang University, Yuan Yuan Beihang University
14:30
10m
Talk
Using Active Learning to Train Predictive Mutation Testing with Minimal Data
Research Papers
Miklos Borsi Karlsruhe Institute of Technology
14:40
10m
Talk
Clarifying Semantics of In-Context Examples for Unit Test Generation
Research Papers
Chen Yang Tianjin University, Lin Yang Tianjin University, Ziqi Wang Tianjin University, Dong Wang Tianjin University, Jianyi Zhou Huawei Cloud Computing Technologies Co., Ltd., Junjie Chen Tianjin University
14:50
10m
Talk
An empirical study of test case prioritization on the Linux Kernel
Journal-First Track
Haichi Wang College of Intelligence and Computing, Tianjin University, Ruiguo Yu College of Intelligence and Computing, Tianjin University, Dong Wang Tianjin University, Yiheng Du College of Intelligence and Computing, Tianjin University, Yingquan Zhao Tianjin University, Junjie Chen Tianjin University, Zan Wang Tianjin University
15:00
10m
Talk
Automated Generation of Issue-Reproducing Tests by Combining LLMs and Search-Based Testing
Research Papers
Konstantinos Kitsios University of Zurich, Marco Castelluccio Mozilla, Alberto Bacchelli University of Zurich
Pre-print
15:10
10m
Talk
Using Fourier Analysis and Mutant Clustering to Accelerate DNN Mutation Testing
Research Papers
Ali Ghanbari Auburn University, Sasan Tavakkol Google Research
15:20
10m
Talk
WEST: Specification-Based Test Generation for WebAssembly
Research Papers