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ICSE 2021
Mon 17 May - Sat 5 June 2021

IoT systems are rapidly adopted in various domains, from embedded systems to smart homes. Despite their growing adoption and popularity, there has been no thorough study to understand IoT development challenges from the practitioners’ point of view. We provide the first systematic study of bugs and challenges that IoT developers face in practice, through a large-scale empirical investigation. We collected 5,565 bug reports from 91 representative IoT project repositories and categorized a random sample of 323 based on the observed failures, root causes, and the locations of the faulty components. In addition, we conducted nine interviews with IoT experts to uncover more details about IoT bugs and to gain insight into IoT developers’ challenges. Lastly, we surveyed 194 IoT developers to validate our findings and gain further insights. We propose the first bug taxonomy for IoT systems based on our results. We highlight frequent bug categories and their root causes, correlations between them, and common pitfalls and challenges that IoT developers face. We recommend future directions for IoT areas that require research and development attention.

Wed 26 May

Displayed time zone: Amsterdam, Berlin, Bern, Rome, Stockholm, Vienna change

20:40 - 21:40
2.6.3. Defect Prediction: Data Issues and Bug ClassificationTechnical Track / Journal-First Papers at Blended Sessions Room 3 +12h
Chair(s): Federica Sarro University College London
20:40
20m
Full-paper
Early Life Cycle Software Defect Prediction. Why? How?Technical Track
Technical Track
Shrikanth N C North Carolina State University, Suvodeep Majumder North Carolina State University, Tim Menzies North Carolina State University, USA
Pre-print Media Attached
21:00
20m
Paper
On the Time-Based Conclusion Stability of Cross-Project Defect Prediction ModelsJournal-First
Journal-First Papers
Abdul Ali Bangash University of Alberta, Canada, Hareem Sahar University of Alberta, Abram Hindle University of Alberta, Karim Ali University of Alberta
Pre-print Media Attached
21:20
20m
Paper
IoT Bugs and Development ChallengesArtifact ReusableTechnical Track
Technical Track
Amir Makhshari University of British Columbia (UBC), Ali Mesbah University of British Columbia (UBC)
Pre-print Media Attached

Thu 27 May

Displayed time zone: Amsterdam, Berlin, Bern, Rome, Stockholm, Vienna change

08:40 - 09:40
2.6.3. Defect Prediction: Data Issues and Bug ClassificationJournal-First Papers / Technical Track at Blended Sessions Room 3
08:40
20m
Full-paper
Early Life Cycle Software Defect Prediction. Why? How?Technical Track
Technical Track
Shrikanth N C North Carolina State University, Suvodeep Majumder North Carolina State University, Tim Menzies North Carolina State University, USA
Pre-print Media Attached
09:00
20m
Paper
On the Time-Based Conclusion Stability of Cross-Project Defect Prediction ModelsJournal-First
Journal-First Papers
Abdul Ali Bangash University of Alberta, Canada, Hareem Sahar University of Alberta, Abram Hindle University of Alberta, Karim Ali University of Alberta
Pre-print Media Attached
09:20
20m
Paper
IoT Bugs and Development ChallengesArtifact ReusableTechnical Track
Technical Track
Amir Makhshari University of British Columbia (UBC), Ali Mesbah University of British Columbia (UBC)
Pre-print Media Attached