ICST 2025
Mon 31 March - Fri 4 April 2025 Naples, Italy
Tue 1 Apr 2025 16:30 - 16:50 at Room B - Technical Program

Artificial intelligence (AI) is transforming software testing by enabling large-scale test data generation and analysis. However, the lack of traceability between large-scale test libraries and system requirements undermines confidence in the testing process. The paper addresses this challenge by proposing a traceability solution tailored to an industrial setting characterized by a data-driven approach. Building on an existing model-based testing framework, the design extends its annotation capabilities through a multilayer taxonomy. The suggested architecture leverages AI techniques for bidirectional mapping: linking requirements to test scripts for coverage analysis and tracing test scripts back to requirements to understand the tested functionality. The approach addresses industrial-scale challenges, improving efficiency and transparency in managing large volumes of test data.

Tue 1 Apr

Displayed time zone: Amsterdam, Berlin, Bern, Rome, Stockholm, Vienna change

16:00 - 17:20
Technical ProgramAIST at Room B
16:00
30m
Talk
Generating Latent Space-Aware Test Cases for Neural Networks Using Gradient-Based Search
AIST
Simon Speth Technical University of Munich, Christoph Jasper TUM, Claudius Jordan , Alexander Pretschner TU Munich
Pre-print
16:30
20m
Talk
Test2Text: AI-Based Mapping between Autogenerated Tests and Atomic Requirements
AIST
Elena Treshcheva Exactpro, Iosif Itkin Exactpro Systems, Rostislav Yavorskiy Exactpro Systems, A: Nikolai Dorofeev
16:50
30m
Talk
LLM Prompt Engineering for Automated White-Box Integration Test Generation in REST APIs (pre-recorded video presentation + online Q&A)
AIST
André Mesquita Rincon Federal Institute of Tocantins (IFTO) / Federal University of São Carlos (UFSCar), Auri Vincenzi Federal University of São Carlos, João Pascoal Faria Faculty of Engineering, University of Porto and INESC TEC
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