ICST 2025 (series) / Industry /
Integrating LLM-based Text Generation with Dynamic Context Retrieval for GUI Testing
This program is tentative and subject to change.
This program is tentative and subject to change.
Wed 2 AprDisplayed time zone: Amsterdam, Berlin, Bern, Rome, Stockholm, Vienna change
Wed 2 Apr
Displayed time zone: Amsterdam, Berlin, Bern, Rome, Stockholm, Vienna change
11:00 - 12:30 | LLMs in TestingResearch Papers / Industry / Journal-First Papers at Aula Magna (AM) Chair(s): Phil McMinn University of Sheffield | ||
11:00 15mTalk | AugmenTest: Enhancing Tests with LLM-driven Oracles Research Papers Shaker Mahmud Khandaker Fondazione Bruno Kessler, Fitsum Kifetew Fondazione Bruno Kessler, Davide Prandi Fondazione Bruno Kessler, Angelo Susi Fondazione Bruno Kessler Pre-print | ||
11:15 15mTalk | Impact of Large Language Models of Code on Fault Localization Research Papers Suhwan Ji Yonsei University, Sanghwa Lee Kangwon National University, Changsup Lee Kangwon National University, Yo-Sub Han Yonsei University, Hyeonseung Im Kangwon National University, South Korea | ||
11:30 15mTalk | An Analysis of LLM Fine-Tuning and Few-Shot Learning for Flaky Test Detection and Classification Research Papers | ||
11:45 15mTalk | Evaluating the Effectiveness of LLMs in Detecting Security Vulnerabilities Research Papers Avishree Khare , Saikat Dutta Cornell University, Ziyang Li University of Pennsylvania, Alaia Solko-Breslin University of Pennsylvania, Mayur Naik UPenn, Rajeev Alur University of Pennsylvania | ||
12:00 15mTalk | FlakyFix: Using Large Language Models for Predicting Flaky Test Fix Categories and Test Code Repair Journal-First Papers Sakina Fatima University of Ottawa, Hadi Hemmati York University, Lionel Briand University of Ottawa, Canada; Lero centre, University of Limerick, Ireland | ||
12:15 15mTalk | Integrating LLM-based Text Generation with Dynamic Context Retrieval for GUI Testing Industry Juyeon Yoon Korea Advanced Institute of Science and Technology, Seah Kim Samsung Research, Somin Kim Korea Advanced Institute of Science and Technology, Sukchul Jung Samsung Research, Shin Yoo Korea Advanced Institute of Science and Technology | ||