ICST 2025 (series) / Industry /
Taming Uncertainty for Critical Scenario Generation in Automated Driving
This program is tentative and subject to change.
Thu 3 Apr 2025 11:45 - 12:00 at Aula Magna (AM) - Testing ML Systems and Fault Localisation Chair(s): Atif Memon
This program is tentative and subject to change.
Thu 3 AprDisplayed time zone: Amsterdam, Berlin, Bern, Rome, Stockholm, Vienna change
Thu 3 Apr
Displayed time zone: Amsterdam, Berlin, Bern, Rome, Stockholm, Vienna change
11:00 - 12:30 | Testing ML Systems and Fault LocalisationIndustry / Research Papers at Aula Magna (AM) Chair(s): Atif Memon Apple | ||
11:00 15mTalk | On Accelerating Deep Neural Network Mutation Analysis by Neuron and Mutant Clustering Research Papers Pre-print | ||
11:15 15mTalk | Benchmarking Image Perturbations for Testing Automated Driving Assistance Systems Research Papers Stefano Carlo Lambertenghi Technische Universität München, fortiss GmbH, Hannes Leonhard Technical University of Munich, Andrea Stocco Technical University of Munich, fortiss Pre-print | ||
11:30 15mTalk | Turbulence: Systematically and Automatically Testing Instruction-Tuned Large Language Models for Code Research Papers Shahin Honarvar Imperial College London, Mark van der Wilk University of Oxford, Alastair F. Donaldson Imperial College London | ||
11:45 15mTalk | Taming Uncertainty for Critical Scenario Generation in Automated Driving Industry Selma Grosse DENSO Automotive GmbH, Dejan Nickovic Austrian Institute of Technology, Cristinel Mateis AIT Austrian Institute of Technology GmbH, Alessio Gambi Austrian Institute of Technology (AIT), Adam Molin DENSO AUTOMOTIVE | ||
12:00 15mTalk | Multi-Project Just-in-Time Software Defect Prediction Based on Multi-Task Learning for Mobile Applications Research Papers Feng Chen Chongqing University of Posts and Telecommunications, Ke Yuxin Chongqing University of Posts and Telecommunications, Liu Xin Chongqing University of Posts and Telecommunications, Wei Qingjie Chongqing University of Posts and Telecommunications | ||
12:15 15mTalk | Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces Industry Neetha Jambigi University of Cologne, Bartosz Bogacz SAP SE, Moritz Mueller SAP SE, Thomas Bach SAP, Michael Felderer German Aerospace Center (DLR) & University of Cologne | ||