ICST 2025
Mon 31 March - Fri 4 April 2025 Naples, Italy
Thu 3 Apr 2025 11:00 - 11:15 at Aula Magna (AM) - Testing ML Systems and Fault Localisation Chair(s): Atif Memon

Mutation analysis of deep neural networks (DNNs) is a promising method for effective evaluation of test data quality and model robustness, but it can be computationally expensive, especially for large models. To alleviate this, we present DEEPMAACC, a technique and a tool that speeds up DNN mutation analysis through neuron and mutant clustering. DEEPMAACC implements two methods: (1) neuron clustering to reduce the number of generated mutants and (2) mutant clustering to reduce the number of mutants to be tested by selecting representative mutants for testing. Both use hierarchical agglomerative clustering to group neurons and mutants with similar weights, with the goal of improving efficiency while maintaining mutation score.

DEEPMAACC has been evaluated on 8 DNN models across 4 popular classification datasets and two DNN architectures. When compared to exhaustive, or vanilla, mutation analysis, the results provide empirical evidence that neuron clustering approach, on average, accelerates mutation analysis by 72.44%, with an average -27.84% error in mutation score. Meanwhile, mutant clustering approach, on average, accelerates mutation analysis by 39.48%, with an average -1.64% error in mutation score. Our results demonstrate that a trade-off can be made between mutation testing speed and mutation score error.

Thu 3 Apr

Displayed time zone: Amsterdam, Berlin, Bern, Rome, Stockholm, Vienna change

11:00 - 12:30
Testing ML Systems and Fault LocalisationIndustry / Research Papers at Aula Magna (AM)
Chair(s): Atif Memon Apple
11:00
15m
Talk
On Accelerating Deep Neural Network Mutation Analysis by Neuron and Mutant Clustering
Research Papers
Lauren Lyons Auburn University, Ali Ghanbari Auburn University
Pre-print
11:15
15m
Talk
Benchmarking Image Perturbations for Testing Automated Driving Assistance Systems
Research Papers
Stefano Carlo Lambertenghi Technische Universität München, fortiss GmbH, Hannes Leonhard Technical University of Munich, Andrea Stocco Technical University of Munich, fortiss
Pre-print
11:30
15m
Talk
Turbulence: Systematically and Automatically Testing Instruction-Tuned Large Language Models for Code
Research Papers
Shahin Honarvar Imperial College London, Mark van der Wilk University of Oxford, Alastair F. Donaldson Imperial College London
11:45
15m
Talk
Taming Uncertainty for Critical Scenario Generation in Automated Driving
Industry
Selma Grosse DENSO Automotive GmbH, Dejan Nickovic Austrian Institute of Technology, Cristinel Mateis AIT Austrian Institute of Technology GmbH, Alessio Gambi Austrian Institute of Technology (AIT), Adam Molin DENSO AUTOMOTIVE
12:00
15m
Talk
Multi-Project Just-in-Time Software Defect Prediction Based on Multi-Task Learning for Mobile Applications
Research Papers
Feng Chen Chongqing University of Posts and Telecommunications, Ke Yuxin Chongqing University of Posts and Telecommunications, Liu Xin Chongqing University of Posts and Telecommunications, Wei Qingjie Chongqing University of Posts and Telecommunications
12:15
15m
Talk
Fault Localization via Fine-tuning Large Language Models with Mutation Generated Stack Traces
Industry
Neetha Jambigi University of Cologne, Bartosz Bogacz SAP SE, Moritz Mueller SAP SE, Thomas Bach SAP, Michael Felderer German Aerospace Center (DLR) & University of Cologne
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