Witness Test Program Generation Through AST Node Combinations (NEXTA 2025 - 8th IEEE Workshop on Next Level of Test Automation) - ICST 2025

Mon 31 March - Fri 4 April 2025 Naples, Italy

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When

Mon 31 Mar 2025 11:25 - 11:50 at Room C - Testing with LLMs & Fault Localization

This program is tentative and subject to change.

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Session Program

Mon 31 Mar
Displayed time zone: Amsterdam, Berlin, Bern, Rome, Stockholm, Vienna change

	11:00 - 12:30	Testing with LLMs & Fault LocalizationNEXTA at Room C

	11:00 25m Research paper		Influence of Pure and Unit-Like Tests on SBFL Effectiveness: An Empirical Study. NEXTA Attila Szatmári , Tamás Gergely Department of Software Engineering, University of Szeged, Árpád Beszédes Department of Software Engineering, University of Szeged
	11:25 25m Research paper		Witness Test Program Generation Through AST Node Combinations NEXTA HeuiChan Lim Davidson College
	11:50 25m Research paper		Adaptive Testing for LLM-Based Applications: A Diversity-based Approach NEXTA Juyeon Yoon Korea Advanced Institute of Science and Technology, Robert Feldt Chalmers \| University of Gothenburg, Blekinge Institute of Technology, Shin Yoo Korea Advanced Institute of Science and Technology
	12:15 10m Other		Future Work in Test Automation NEXTA
	12:25 5m Day closing		Closing NEXTA

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HeuiChan Lim

Davidson College

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