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Wed 12 Jul 2017 15:30 - 15:55 at Bren 1414 - Static Analysis Chair(s): William G.J. Halfond

We present the concept of Just-In-Time (JIT) static analysis that interleaves code development and bug fixing in an integrated development environment. Unlike traditional batch-style analysis tools, a JIT analysis tool presents warnings to code developers over time, providing the most relevant results quickly, and computing less relevant results incrementally later. In this paper, we describe general guidelines for designing JIT analyses. We also present a general recipe for transforming static data-flow analyses to JIT analyses through a concept of layered analysis execution. We illustrate this transformation through CHEETAH, a JIT taint analysis for Android applications. Our empirical evaluation of CHEETAH on real-world applications shows that our approach returns warnings quickly enough to avoid disrupting the normal workflow of developers. This result is confirmed by our user study, in which developers fixed data leaks twice as fast when using CHEETAH compared to an equivalent batch-style analysis.

Wed 12 Jul

issta-2017-research
15:30 - 17:10: Technical Papers - Static Analysis at Bren 1414
Chair(s): William G.J. HalfondUniversity of Southern California
issta-2017-research15:30 - 15:55
Talk
Lisa Nguyen Quang DoFraunhofer IEM, Karim AliUniversity of Alberta, Benjamin LivshitsImperial College London, UK, Eric BoddenHeinz Nixdorf Institut, Paderborn University and Fraunhofer IEM, Justin SmithNorth Carolina State University, Emerson Murphy-HillNorth Carolina State University
DOI
issta-2017-research15:55 - 16:20
Talk
Alex GyoriUniversity of Illinois at Urbana-Champaign, USA, Shuvendu K. LahiriMicrosoft Research, Nimrod PartushTechnion
DOI
issta-2017-research16:20 - 16:45
Talk
Xiaokang Fan, Yulei Sui, Xiangke LiaoNational University of Defense Technology, China, Jingling XueUNSW Australia
DOI
issta-2017-research16:45 - 17:10
Talk
John-Paul OreUniversity of Nebraska-Lincoln, USA, Sebastian ElbaumUniversity of Nebraska-Lincoln, USA, Carrick DetweilerUniversity of Nebraska-Lincoln, USA
DOI