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ISSTA 2021
Sun 11 - Sat 17 July 2021 Online
co-located with ECOOP and ISSTA 2021
Fri 16 Jul 2021 08:20 - 08:40 at ISSTA 1 - Session 15 (time band 3) Testing 1 Chair(s): Phil McMinn
Sat 17 Jul 2021 01:30 - 01:50 at ISSTA 1 - Session 21 (time band 2) Testing 3 Chair(s): Rohan Padhye

MC/DC coverage prescribes a set of \emph{MC/DC sequences}.
Such a sequence is defined by a specification of the
truth values of certain atomic boolean expressions which appear in
predicates (i.e. boolean combinations of atomic boolean expressions) in
the program. An execution trace \emph{satisfies} the sequence if it
\emph{realizes} the atomic boolean conditions in accordance with the truth
value specification of the sequence. An MC/DC sequence is \emph{feasible}
if there is one such execution trace. The overall goal for an MC/DC test
generator is, for each sequence: if \emph{feasible}, to
generate a test input realizing the sequence; otherwise,
to \emph{prove} that the sequence is infeasible.

In this paper, we propose a method whose aim is \emph{optimal} MC/DC
coverage for bounded programs, i.e. for each MC/DC sequence, the
method either produces a test input, or proves that sequence is
infeasible. The method is based on symbolic execution with
interpolation, and in this paper, we present a \emph{customized}
interpolation algorithm. We then present a comprehensive experimental
evaluation comparing with the only available system CBMC
which can operate on reasonably large programs, and further, which can
provide optimal coverage for many examples. We will use a benchmark based
on RERS which contains the kinds of reactive programs for which MC/DC
was motivated by. We show that our method, by a significant margin,
surpasses CBMC. In particular, our method often produces an
\emph{optimal} MC/DC result.

Fri 16 Jul

Displayed time zone: Brussels, Copenhagen, Madrid, Paris change

08:00 - 09:00
Session 15 (time band 3) Testing 1Technical Papers at ISSTA 1
Chair(s): Phil McMinn University of Sheffield
08:00
20m
Talk
Empirically Evaluating Readily Available Information for Regression Test Optimization in Continuous Integration
Technical Papers
Daniel Elsner TU Munich, Florian Hauer TU Munich, Alexander Pretschner TU Munich, Silke Reimer IVU Traffic Technologies
DOI
08:20
20m
Talk
Toward Optimal MC/DC Test Case Generation
Technical Papers
Sangharatna Godboley National Institute of Technology Warangal, Joxan Jaffar National University of Singapore, Rasool Maghareh Huawei, Arpita Dutta National University of Singapore
DOI
08:40
20m
Talk
Log-Based Slicing for System-Level Test Cases
Technical Papers
Salma Messaoudi University of Luxembourg, Donghwan Shin University of Luxembourg, Annibale Panichella Delft University of Technology; University of Luxembourg, Domenico Bianculli University of Luxembourg, Lionel Briand University of Luxembourg; University of Ottawa
DOI Media Attached

Sat 17 Jul

Displayed time zone: Brussels, Copenhagen, Madrid, Paris change

01:10 - 02:30
Session 21 (time band 2) Testing 3Technical Papers at ISSTA 1
Chair(s): Rohan Padhye Carnegie Mellon University
01:10
20m
Talk
Continuous Test Suite Failure Prediction
Technical Papers
Cong Pan Beihang University, Michael Pradel University of Stuttgart
DOI Media Attached
01:30
20m
Talk
Toward Optimal MC/DC Test Case Generation
Technical Papers
Sangharatna Godboley National Institute of Technology Warangal, Joxan Jaffar National University of Singapore, Rasool Maghareh Huawei, Arpita Dutta National University of Singapore
DOI
01:50
20m
Talk
Challenges and Opportunities: An In-Depth Empirical Study on Configuration Error Injection Testing
Technical Papers
Wang Li National University of Defense Technology, Zhouyang Jia National University of Defense Technology, Shanshan Li National University of Defense Technology, Yuanliang Zhang National University of Defense Technology, Teng Wang National University of Defense Technology, Erci Xu National University of Defense Technology, Ji Wang National University of Defense Technology, Liao Xiangke National University of Defense Technology
DOI File Attached
02:10
20m
Talk
Test-Case Prioritization for Configuration TestingACM SIGSOFT Distinguished Paper
Technical Papers
Runxiang Cheng University of Illinois at Urbana-Champaign, Lingming Zhang University of Illinois at Urbana-Champaign, Darko Marinov University of Illinois at Urbana-Champaign, Tianyin Xu University of Illinois at Urbana-Champaign
DOI