Toward Optimal MC/DC Test Case Generation
Sat 17 Jul 2021 01:30 - 01:50 at ISSTA 1 - Session 21 (time band 2) Testing 3 Chair(s): Rohan Padhye
MC/DC coverage prescribes a set of \emph{MC/DC sequences}.
Such a sequence is defined by a specification of the
truth values of certain atomic boolean expressions which appear in
predicates (i.e. boolean combinations of atomic boolean expressions) in
the program. An execution trace \emph{satisfies} the sequence if it
\emph{realizes} the atomic boolean conditions in accordance with the truth
value specification of the sequence. An MC/DC sequence is \emph{feasible}
if there is one such execution trace. The overall goal for an MC/DC test
generator is, for each sequence: if \emph{feasible}, to
generate a test input realizing the sequence; otherwise,
to \emph{prove} that the sequence is infeasible.
In this paper, we propose a method whose aim is \emph{optimal} MC/DC
coverage for bounded programs, i.e. for each MC/DC sequence, the
method either produces a test input, or proves that sequence is
infeasible. The method is based on symbolic execution with
interpolation, and in this paper, we present a \emph{customized}
interpolation algorithm. We then present a comprehensive experimental
evaluation comparing with the only available system CBMC
which can operate on reasonably large programs, and further, which can
provide optimal coverage for many examples. We will use a benchmark based
on RERS which contains the kinds of reactive programs for which MC/DC
was motivated by. We show that our method, by a significant margin,
surpasses CBMC. In particular, our method often produces an
\emph{optimal} MC/DC result.
Fri 16 JulDisplayed time zone: Brussels, Copenhagen, Madrid, Paris change
08:00 - 09:00 | Session 15 (time band 3) Testing 1Technical Papers at ISSTA 1 Chair(s): Phil McMinn University of Sheffield | ||
08:00 20mTalk | Empirically Evaluating Readily Available Information for Regression Test Optimization in Continuous Integration Technical Papers Daniel Elsner TU Munich, Florian Hauer TU Munich, Alexander Pretschner TU Munich, Silke Reimer IVU Traffic Technologies DOI | ||
08:20 20mTalk | Toward Optimal MC/DC Test Case Generation Technical Papers Sangharatna Godboley National Institute of Technology Warangal, Joxan Jaffar National University of Singapore, Rasool Maghareh Huawei, Arpita Dutta National University of Singapore DOI | ||
08:40 20mTalk | Log-Based Slicing for System-Level Test Cases Technical Papers Salma Messaoudi University of Luxembourg, Donghwan Shin University of Luxembourg, Annibale Panichella Delft University of Technology; University of Luxembourg, Domenico Bianculli University of Luxembourg, Lionel Briand University of Luxembourg; University of Ottawa DOI Media Attached |
Sat 17 JulDisplayed time zone: Brussels, Copenhagen, Madrid, Paris change
01:10 - 02:30 | Session 21 (time band 2) Testing 3Technical Papers at ISSTA 1 Chair(s): Rohan Padhye Carnegie Mellon University | ||
01:10 20mTalk | Continuous Test Suite Failure Prediction Technical Papers DOI Media Attached | ||
01:30 20mTalk | Toward Optimal MC/DC Test Case Generation Technical Papers Sangharatna Godboley National Institute of Technology Warangal, Joxan Jaffar National University of Singapore, Rasool Maghareh Huawei, Arpita Dutta National University of Singapore DOI | ||
01:50 20mTalk | Challenges and Opportunities: An In-Depth Empirical Study on Configuration Error Injection Testing Technical Papers Wang Li National University of Defense Technology, Zhouyang Jia National University of Defense Technology, Shanshan Li National University of Defense Technology, Yuanliang Zhang National University of Defense Technology, Teng Wang National University of Defense Technology, Erci Xu National University of Defense Technology, Ji Wang National University of Defense Technology, Liao Xiangke National University of Defense Technology DOI File Attached | ||
02:10 20mTalk | Test-Case Prioritization for Configuration TestingACM SIGSOFT Distinguished Paper Technical Papers Runxiang Cheng University of Illinois at Urbana-Champaign, Lingming Zhang University of Illinois at Urbana-Champaign, Darko Marinov University of Illinois at Urbana-Champaign, Tianyin Xu University of Illinois at Urbana-Champaign DOI |