EASE 2023
Tue 13 - Fri 16 June 2023 Oulu, Finland
Wed 14 Jun 2023 14:40 - 14:50 at Aurora Hall - Repository Mining Chair(s): César França

Automated unit test generation has been extensively studied, with prior research mostly focusing on dynamically compiled or dynamically typed programming languages like Java and Python. However, Go, a popular statically compiled and typed programming language used extensively in server application development, has received limited support from existing tools. To address this gap, we present NxtUnit, an automatic unit test generation tool for Go that uses random testing and is well-suited for microservice architecture. NxtUnit employs a random approach to generate unit tests quickly, making it ideal for smoke testing and providing quick quality feedback. It comes with three types of interfaces: an integrated development environment (IDE) plugin, a command-line interface (CLI) tool, and a browser-based platform. The plugin and CLI tool allow engineers to write unit tests more efficiently, while the platform provides unit test visualization and asynchronous unit test generation. We evaluated NxtUnit by generating unit tests for 13 public open-source repositories and 500 ByteDance in-house repositories, resulting in a code coverage of 20.74% for in-house repositories. We conducted a survey among Bytedance engineers and found that NxtUnit can save them 48% of the time they previously spent on writing unit tests. We have made the tool available at https://github.com/bytedance/nxt_unit.

Wed 14 Jun

Displayed time zone: Athens change

13:30 - 15:00
Repository MiningIndustry / Short Papers and Posters / Research (Full Papers) at Aurora Hall
Chair(s): César França Universidade Federal Rural de Pernambuco
13:30
20m
Paper
An Empirical Study on Continuous Integration Trends, Topics and Challenges in Stack Overflow
Research (Full Papers)
Ali Ouni ETS Montreal, University of Quebec, Islem Saidani ETS, Eman Abdullah AlOmar Stevens Institute of Technology, Mohamed Wiem Mkaouer Rochester Institute of Technology
Link to publication DOI Media Attached File Attached
13:50
10m
Paper
Are security commit messages informative? Not enough!Industry Experience Report
Industry
Sofia Reis Instituto Superior Técnico, U. Lisboa & INESC-ID, Rui Abreu Faculty of Engineering, University of Porto, Corina S. Pasareanu Carnegie Mellon University Silicon Valley, NASA Ames Research Center
Link to publication DOI
14:00
20m
Paper
Analyzing the Resource Usage Overhead of Mobile App Development Frameworks
Research (Full Papers)
Wellington de Oliveira Júnior University of Lisbon, Bernardo de Moraes Santana Júnior , Fernando Castor Utrecht University & Federal University of Pernambuco, João Paulo Fernandes LIACC, Universidade do Porto, Porto, Portugal
Link to publication Pre-print File Attached
14:20
10m
Short-paper
Analysis of Bug Report Qualities with Fixing Time using a Bayesian NetworkShort Paper
Short Papers and Posters
Sien Reeve O. Peralta Waseda University, Hironori Washizaki Waseda University, Yoshiaki Fukazawa Waseda University, Yuki Noyori Hitachi, Ltd., Shuhei Nojiri Hitachi, Ltd., Yokohama Reserch Laboratory, Hideyuki Kanuka Hitachi, Ltd.
DOI File Attached
14:30
10m
Short-paper
Outside the Sandbox: A Study of Input/Output Methods in JavaShort Paper
Short Papers and Posters
Matúš Sulír Technical University of Košice, Sergej Chodarev Technical University of Košice, Milan Nosáľ ValeSoft, s.r.o.
DOI Pre-print File Attached
14:40
10m
Paper
NxtUnit: Automated Unit Test Generation for GoIndustry Experience Report
Industry
Siwei Wang bytedance, Xue Mao bytedance, Ziguang Cao bytedance, Yujun Gao bytedance, Qucheng Shen bytedance, Chao Peng ByteDance, China
DOI Pre-print Media Attached
14:50
10m
Short-paper
Identifying Characteristics of the Agile Development Process That Impact User SatisfactionShort Paper
Short Papers and Posters
Minshun Yang Department of Computer Science and Communications Engineering, Waseda University, Seiji Sato Department of Computer Science and Communications Engineering, Waseda University, Hironori Washizaki Waseda University, Yoshiaki Fukazawa Waseda University, Juichi Takahashi AGEST, Inc
DOI Pre-print File Attached