* ICSE 2018 *
Sun 27 May - Sun 3 June 2018 Gothenburg, Sweden
Wed 30 May 2018 11:00 - 11:15 at E3 room - Security, Safety, and Quality Chair(s): Michael Whalen

abstract

Wed 30 May

Displayed time zone: Amsterdam, Berlin, Bern, Rome, Stockholm, Vienna change

11:00 - 12:30
Security, Safety, and QualityNIER - New Ideas and Emerging Results at E3 room
Chair(s): Michael Whalen University of Minnesota
11:00
15m
Talk
Generative Secure Design, Defined
NIER - New Ideas and Emerging Results
Riccardo Scandariato , Jennifer Horkhoff , Robert Feldt Chalmers University of Technology
11:15
15m
Talk
Towards Secure Dynamic Product Lines in the Cloud
NIER - New Ideas and Emerging Results
Sebastian Krieter Magdeburg University, Jacob Krüger Harz University of Applied Sciences, Germany, Nico Weichbrodt , Vasily Sartakov , Rüdiger Kapitza Technical University of Braunschweig, Thomas Leich Harz University of Applied Sciences, Germany
11:30
15m
Talk
Towards Forensic-Ready Software Systems
NIER - New Ideas and Emerging Results
Liliana Pasquale University College Dublin & Lero, Ireland, Dalal Alrajeh Imperial College London, Claudia Peersman , Thein Tun , Bashar Nuseibeh The Open University (UK) & Lero (Ireland), Awais Rashid University of Bristol, UK
11:45
15m
Talk
Measure Confidence of Assurance Cases in Safety-Critical Domains
NIER - New Ideas and Emerging Results
12:00
15m
Talk
A Critical Review of "A Practical Guide to Select Quality Indicators for Assessing Pareto-Based Search Algorithms in Search-Based Software Engineering": Essay on Quality Indicator Selection for SBSE
NIER - New Ideas and Emerging Results
Miqing Li University of Birmingham, UK, Tao Chen Nottingham Trent University, UK and University of Birmingham, UK, Xin Yao
12:15
15m
Talk
Enabling Real-Time Feedback in Software Engineering
NIER - New Ideas and Emerging Results
Enrique Larios Vargas Software Improvement Group, Joseph Hejderup Delft University of Technology, Netherlands, Maria Kechagia Delft University of Technology, Magiel Bruntink , Georgios Gousios TU Delft
DOI Pre-print