Write a Blog >>
ICSE 2023
Sun 14 - Sat 20 May 2023 Melbourne, Australia
Fri 19 May 2023 14:15 - 14:30 at Meeting Room 105 - Fault injection and mutation Chair(s): Lingxiao Jiang

Identifying the origins of potentially injected defects in implementation activities during requirement analysis and design activities is challenging, but leads to the prevention of defects, which are burdensome to correct. This study investigates whether such defect injection risks can be generalized and defined by risk occurrence conditions of the objects in the existing analysis and design diagrams and whether the defined defect injection risks are applicable to other analysis and design diagrams. Specifically, we identify defect categories, which are injected after analysis and design activities and subsequently detected during system testing of commercial products developed at Sony. Then, regarding the defect categories as the exposed defect injection risks, we define defect injection risks with the objects defined in the analysis and design diagrams of the products. Each defect injection risk consists of risk description, diagram type, and occurrence conditions of objects in the diagrams. Afterwards, we evaluate whether the defined defect injection risks appear in the analysis and design diagrams of three different products under development and five publicly available analysis and design diagrams. The results showed that three defect injection risks were defined and that the two risks appear in the analysis and design diagrams of the three products and the remaining one appears in the analysis and design diagrams of two products. The results also showed that one defect injection risk is present in all five publicly available analysis and design diagrams, and two risks appear in four of the diagrams. The three defect injection risks are general enough to identify risks in analysis and design diagrams from other domains. Developers can be more cautious about the risks and prevent defect injections with the defect injection risks.

Fri 19 May

Displayed time zone: Hobart change

13:45 - 15:15
13:45
15m
Talk
Coverage Guided Fault Injection for Cloud Systems
Technical Track
Yu Gao Institute of Software, Chinese Academy of Sciences, China, Wensheng Dou Institute of Software Chinese Academy of Sciences, Dong Wang Institute of software, Chinese academy of sciences, Wenhan Feng Institute of Software Chinese Academy of Sciences, Jun Wei Institute of Software at Chinese Academy of Sciences; University of Chinese Academy of Sciences; University of Chinese Academy of Sciences Chongqing School, Hua Zhong Institute of Software Chinese Academy of Sciences, Tao Huang Institute of Software Chinese Academy of Sciences
Pre-print
14:00
15m
Talk
Diver: Oracle-Guided SMT Solver Testing with Unrestricted Random Mutations
Technical Track
Jongwook Kim Korea University, Sunbeom So Korea University, Hakjoo Oh Korea University
14:15
15m
Talk
Identifying Defect Injection Risks from Analysis and Design Diagrams: An Industrial Case Study at Sony
SEIP - Software Engineering in Practice
Yoji Imanishi Sony Global Manufacturing&Operations, Kazuhiro Kumon Sony Global Manufacturing&Operations, Shuji Morisaki Nagoya University
14:30
7m
Talk
DaMAT: A Data-driven Mutation Analysis Tool
DEMO - Demonstrations
Enrico Viganò University of Luxembourg, Oscar Cornejo SnT Centre, University of Luxembourg, Fabrizio Pastore University of Luxembourg, Lionel Briand University of Luxembourg; University of Ottawa
Pre-print
14:37
7m
Talk
Mutation testing in the wild: findings from GitHub
Journal-First Papers
Ana B. Sánchez University of Seville, Pedro Delgado-Pérez Universidad de Cádiz, Inmaculada Medina-Bulo Universidad de Cádiz, Sergio Segura University of Seville
Link to publication DOI
14:45
7m
Talk
An Experimental Assessment of Using Theoretical Defect Predictors to Guide Search-Based Software Testing
Journal-First Papers
Anjana Perera Oracle Labs, Australia, Aldeida Aleti Monash University, Burak Turhan University of Oulu, Marcel Böhme MPI-SP, Germany and Monash University, Australia
Link to publication DOI
14:52
7m
Talk
Assurance Cases as Data: A Manifesto
NIER - New Ideas and Emerging Results
Claudio Menghi McMaster University, Canada, Torin Viger , Alessio Di Sandro University of Toronto, Chris Rees Critical Systems Labs, Jeffrey Joyce Critical System Labs Inc., Marsha Chechik University of Toronto
15:00
7m
Talk
Predictive Mutation Analysis via Natural Language Channel in Source Code
Journal-First Papers
Jinhan Kim KAIST, Juyoung Jeon Handong Global University, Shin Hong Handong Global University, Shin Yoo KAIST
Link to publication Pre-print