We present MASS, a mutation analysis tool for embedded software in cyber-physical systems (CPS). We target space CPS (e.g., satellites) and other CPS with similar characteristics (e.g., UAV).
Mutation analysis measures the quality of test suites in terms of the percentage of artificial faults detected. There are many mutation analysis tools available but they are inapplicable to CPS because of scalability and accuracy challenges. To overcome such limitations, MASS implements a set of optimization techniques that enable the applicability of mutation analysis and address scalability and accuracy in the CPS context. MASS has been successfully evaluated on a large study involving embedded software systems provided by industry partners; the study includes an on-board software system managing a microsatellite currently on-orbit, a set of libraries used in deployed CubeSats, and a mathematical library provided by the European Space Agency.
Wed 11 MayDisplayed time zone: Eastern Time (US & Canada) change
04:00 - 05:00 | Software Testing 2DEMO - Demonstrations at ICSE Demo room 1 Chair(s): Jiajun Jiang Tianjin University | ||
04:00 15mDemonstration | QuSBT: Search-Based Testing of Quantum Programs DEMO - Demonstrations Xinyi Wang Nanjing University of Aeronautics and Astronautics, Paolo Arcaini National Institute of Informatics
, Tao Yue Simula Research Laboratory, Norway, Shaukat Ali Simula Research Laboratory, Norway DOI Pre-print Media Attached | ||
04:15 15mDemonstration | MASS: A tool for Mutation Analysis for Space CPS DEMO - Demonstrations Oscar Cornejo SnT Centre, University of Luxembourg, Fabrizio Pastore University of Luxembourg, Lionel Briand University of Luxembourg; University of Ottawa Pre-print Media Attached | ||
04:30 15mDemonstration | TestKnight: An Interactive Assistant to Stimulate Test Engineering DEMO - Demonstrations Cristian-Alexandru Botocan Delft University of Technology, Piyush Deshmukh Delft University of Technology, Pavlos Makridis Delft University of Technology, Jorge Romeu Huidobro Delft University of Technology, Mathanrajan Sundarrajan Delft University of Technology, Maurício Aniche Delft University of Technology, Andy Zaidman Delft University of Technology Pre-print Media Attached | ||
04:45 15mDemonstration | FuzzTastic: A Fine-grained, Fuzzer-agnostic Coverage Analyzer DEMO - Demonstrations Stephan Lipp Technical University of Munich, Daniel Elsner TU Munich, Thomas Hutzelmann Technical University of Munich, Sebastian Banescu Technical University of Munich, Alexander Pretschner TU Munich, Marcel Böhme MPI-SP, Germany and Monash University, Australia DOI Pre-print Media Attached |