Thu 12 May 2022 21:05 - 21:10 at ICSE room 2-odd hours - Machine Learning with and for SE 8 Chair(s): Seok-Won Lee
Fri 27 May 2022 11:00 - 11:05 at Room 301+302 - Papers 19: Machine Learning with and for SE 2 Chair(s): Dalal Alrajeh
Fri 27 May 2022 13:30 - 15:00 at Ballroom Gallery - Posters 3
The SE community needs to be more careful about using off-the-shelf AI tools, without first applying SE knowledge (e.g., those past releases are a good source of knowledge for planning defect reductions). Once that SE knowledge is applied, this can result in dramatically better reasoning.
For example, here is a property of software that is not usually exploited in standard AI tools:
- Software comes in releases and
- Implausible change to software is something that has never been changed in prior releases.
Our TimeLIME exploits this knowledge as follows. When planning how to reduce defects, it is better to use plausible changes,  i.e.,   changes with some precedence in the prior releases. To demonstrate this point, this paper compares several defect reduction planning tools. LIME is a local sensitivity analysis tool that can report the fewest changes needed to alter the classification of some code module (e.g.,  from defective to non-defective). TimeLIME is a new tool, introduced in this paper, that improves LIME by restricting its plans to just those attributes which change the most within a project.
In this study, we compared the performance of LIME and TimeLIME and several other defect reduction planning algorithms. The generated plans were assessed via (a) the similarity scores between the proposed code changes and the real code changes made by developers; and (b) the improvement scores seen within projects that followed the plans. For nine project trials, we found that TimeLIME outperformed all other algorithms (in 8 out of 9 trials). Hence, we strongly recommend using past releases as a source of knowledge for computing fixes for new releases (using TimeLIME).
Wed 11 MayDisplayed time zone: Eastern Time (US & Canada) change
| 11:00 - 12:00 | Machine Learning with and for SE 10Technical Track / SEIP - Software Engineering in Practice / Journal-First Papers at ICSE room 1-odd hours  Chair(s): Preetha Chatterjee Drexel University, USA | ||
| 11:005m Talk | Defect Reduction Planning (using TimeLIME) Journal-First PapersAuthorizer link Pre-print Media Attached | ||
| 11:055m Talk | Automatic Fault Detection for Deep Learning Programs Using Graph Transformations Journal-First Papers Amin Nikanjam École Polytechnique de Montréal, Houssem Ben Braiek  École Polytechnique de Montréal, Mohammad Mehdi Morovati École Polytechnique de Montréal, Foutse Khomh Polytechnique MontréalLink to publication DOI Media Attached | ||
| 11:105m Talk | Counterfactual Explanations for Models of Code SEIP - Software Engineering in Practice Jürgen Cito TU Wien and Meta, Işıl Dillig University of Texas at Austin, Vijayaraghavan Murali Meta Platforms, Inc., Satish Chandra FacebookPre-print Media Attached | ||
| 11:155m Talk | VarCLR: Variable Semantic Representation Pre-training via Contrastive Learning Technical Track Qibin Chen Carnegie Mellon University, Jeremy Lacomis Carnegie Mellon University, Edward J. Schwartz Carnegie Mellon University Software Engineering Institute, Graham Neubig Carnegie Mellon University, Bogdan Vasilescu Carnegie Mellon University, USA, Claire Le Goues Carnegie Mellon UniversityDOI Pre-print Media Attached | ||
| 11:205m Talk | Towards Training Reproducible Deep Learning Models Technical Track Boyuan Chen Centre for Software Excellence, Huawei Canada, Mingzhi Wen Huawei Technologies, Yong Shi Huawei Technologies, Dayi Lin Centre for Software Excellence, Huawei, Canada, Gopi Krishnan Rajbahadur Centre for Software Excellence, Huawei, Canada, Zhen Ming (Jack) Jiang York University Pre-print Media Attached | ||
| 11:255m Talk | Learning to Reduce False Positives in Analytic Bug Detectors Technical Track Anant Kharkar Microsoft, Roshanak Zilouchian Moghaddam Microsoft, Matthew Jin Microsoft Corporation, Xiaoyu Liu Microsoft Corporation, Xin Shi Microsoft Corporation, Colin Clement Microsoft, Neel Sundaresan Microsoft CorporationPre-print Media Attached | ||
